Abstract:
A system and method are presented for use in measuring polarization of an optical beam. The system is configured and operable for determining polarization profile along a cross section of the input optical beam, and comprises an optical system and a pixel matrix. The optical system comprises a polarization beam splitting assembly configured and operable for splitting said input optical beam into a predetermined number of beam components with a predetermined polarization relation between them, the polarization beam splitting assembly comprising a first polarization beam splitter in an optical path of the input optical beam splitting said input optical beam into a first plurality of beam components with a certain polarization relation between them and a birefringent element in an optical path of said first plurality of the beam components for splitting each of them into a pair of beams having ordinary and extraordinary polarizations, thereby producing said predetermined number of output beam components. The pixel matrix is located in substantially non intersecting optical paths of said output beam components and generates a corresponding number of output data pieces indicative of intensity distribution within said output beam components, respectively, data contained in said data pieces being indicative of the polarization profile along the cross section of the input optical beam.
Abstract:
Exemplary thin-film optical devices have first and second layer groups disposed as a layer stack on a substrate. The first layer group comprises a first PPN layer, a first LCP layer, and a first barrier layer all superposed. The second layer group is superposed relative to the first layer group, and includes a second PPN layer, a second LCP layer, and a second barrier layer all superposed. The first and second layer groups cooperate to polarize multiple wavelengths of an incident light flux in a broadband and/or wide-angle manner. Each of the layer groups has an alignment layer, a respective liquid-crystal polymer layer, and a barrier layer.
Abstract:
La présente invention propose un dispositif d'analyse polarimétrique à division de front d'onde précis et robuste, permettant de mesurer de manière quasi instantanée les états de polarisation d'un objet lumineux. Le dispositif d'analyse polarimétrique à division de front d'onde selon l'invention permet de produire, à partir d'un faisceau lumineux amont, une pluralité de faisceaux lumineux polarisés selon des états de polarisation tous différents. Ces faisceaux lumineux polarisés, qui ne se recouvrent pas et qui portent des informations complémentaires en polarisation, sont analysés simultanément par une pluralité de détecteurs qui mesurent l'intensité lumineuse de chacun d'eux. Des moyens de traitement effectuent un traitement numérique sur les valeurs obtenues d'intensité lumineuse pour déterminer l'état de polarisation du faisceau lumineux amont. Selon l'invention, les opérations effectuées par les moyens de traitement sur les valeurs des intensités lumineuses permettent de s'affranchir des variations d'intensité lumineuse des faisceaux lumineux divisés lors de la division du front d'onde du faisceau lumineux amont. Le dispositif d'analyse polarimétrique selon l'invention est ainsi robuste, et sa précision n'est pas dégradée par les conditions expérimentales. L'invention concerne enfin un procédé d'analyse polarimétrique à division de front d'onde pour la détermination de l'état de polarisation d'un faisceau lumineux amont.
Abstract:
A system and method for detection and measurement of circular birefringences in materials, such as optically active (chiral) liquids and materials that exhibit the Faraday effect. The method and apparatus permit the detection of optical activities via the difference in the directions of propagation the left- and the right- circularly polarized light (components). A beam of light is directed at an interface formed by the optically active medium and another medium such that a difference in the angles of refraction and/or reflection and/or diffraction between the left- and the right-circularly polarized components of the light beam can be detected. The difference in the propagation directions between the two circularly polarized light components is measured on a position sensitive detector and/or is detected as an intensity difference. The circular birefringence in isotropic liquids is a measure of their optical purity (enantiomeric excess) and hence the invention presents a method and apparatus to measure chirality. The invention is thus related to optical rotation (polarimetric) measurements, but has the advantage that it does not depend on path-length traversed through the sample.
Abstract:
The invention provides method and apparatus for the resolution of beams of electromagnetic radiation. In one aspect, there is provided a method for resolving overlapping emission spectra, involving: providing a plurality of polarised incident beams (14) of electromagnetic radiation for irradiating a sample (36), each of the beams having a different polarisation; irradiating the sample with the beams; receiving respective return emission spectra from the sample; and resolving (38, 40) the emission spectra according to their respective polarisations. In another aspect, there is provided a method of spatially resolving a beam of electromagnetic radiation according to polarisation, involving: passing the beam through a polarising beam splitter to form first and second orthogonally polarised components; and altering the plane of polarisation of at least the second component and translating the path of at least one of the components, so that the components are polarised in substantially the same plane, are substantially parallel and are spatially displaced.
Abstract:
Apparatus and methods for measuring mode spectra for ion-exchanged glass substrates having a steep index region are disclosed. An interfacing fluid is provided between the coupling prism and the glass substrate. The interfacing fluid thickness is selected so that the variation in modal birefringence with fluid thickness is reduced to an acceptable level. The coupling prism can include a prism coating on the coupling surface so that the substrate-prism interface includes the prism coating. The coupling prism can also include stand-off members that serve to define the thickness of the interfacing fluid.
Abstract:
A short wave infrared polarimeter comprising a pixelated polarizer array and an Indium-Gallium-Arsenide (“InGaAs”) focal plane array. The short wave infrared polarimeter optionally includes a micro-lens array and/or an aperture layer.