LASER SCANNING MICROSCOPE FOR SCANNING ALONG A 3D TRAJECTORY

    公开(公告)号:WO2010007452A3

    公开(公告)日:2010-01-21

    申请号:PCT/HU2009/000057

    申请日:2009-07-14

    Abstract: The invention relates to a laser scanning microscope (10) having: focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13); drive means (18) for displacing the at least one optical element of the focusing means (15) for changing the position of the focal plane (29), and deflecting means (14) for deflecting the laser beam (13). The microscope comprises a control system (32) configured to carry out the steps of: providing a periodical drive signal for the drive means (18); obtaining time dependant displacement data of the at least one optical element of the focusing means (15) in response to the periodical drive signal of the drive means (18); providing a response function (z(t)) using the time dependant displacement data, calculating a drive signal for the deflecting means (14) using the response function (z(t)) to move the focal volume (30) of the laser beam (13) along a given 3D trajectory (48) within a sample to be examined. The invention further relates to a method for carrying out such a scanning operation along a 3D trajectory (48). ˙

    LASER SCANNING MICROSCOPE FOR SCANNING ALONG A 3D TRAJECTORY
    57.
    发明公开
    LASER SCANNING MICROSCOPE FOR SCANNING ALONG A 3D TRAJECTORY 有权
    激光扫描显微镜中采样沿三维TRAIN

    公开(公告)号:EP2307921A2

    公开(公告)日:2011-04-13

    申请号:EP09785758.5

    申请日:2009-07-14

    Applicant: Femtonics Kft.

    CPC classification number: G02B21/0048 G02B21/006 G02B21/0084

    Abstract: The invention relates to a laser scanning microscope (10) having: focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13); drive means (18) for displacing the at least one optical element of the focusing means (15) for changing the position of the focal plane (29), and deflecting means (14) for deflecting the laser beam (13). The microscope comprises a control system (32) configured to carry out the steps of: providing a periodical drive signal for the drive means (18); obtaining time dependant displacement data of the at least one optical element of the focusing means (15) in response to the periodical drive signal of the drive means (18); providing a response function (z(t)) using the time dependant displacement data, calculating a drive signal for the deflecting means (14) using the response function (z(t)) to move the focal volume (30) of the laser beam (13) along a given 3D trajectory (48) within a sample to be examined. The invention further relates to a method for carrying out such a scanning operation along a 3D trajectory (48). ˙

    FOCUSING SYSTEM COMPRISING ACOUSTO-OPTIC DEFLECTORS FOR FOCUSING AN ELECTROMAGNETIC BEAM

    公开(公告)号:CA2748525C

    公开(公告)日:2017-04-04

    申请号:CA2748525

    申请日:2009-12-30

    Applicant: FEMTONICS KFT

    Abstract: The present invention relates to a focusing system (100) for focusing an electromagnetic beam for three-dimensional random access applications, the system comprising a first pair of acousto-optic deflectors (10) for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors (20) for focusing an electromagnetic beam in a Y-Z plane being substantially perpendicular to the X-Z plane, characterised in that the second pair of acousto-optic deflectors (20) are arranged between the acousto-optic deflectors (12, 12') of the first pair of acousto-optic deflectors (10), such that the first and fourth acousto-optic deflectors (12, 12") of the system belong to the first pair of acousto-optic deflectors (10) and the second and third acousto-optic deflectors (22, 22") of the system belong to the second pair of acousto-optic deflectors (20).

Patent Agency Ranking