中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

218 records (took 0.03 seconds)

    SYSTEMS AND METHODS FOR THE IN-LINE MEASUREMENT OF ALKALI METAL-CONTAINING STRUCTURES AND ALKALI ION-CONTAINING STRUCTURES
    51.
    发明公开
    SYSTEMS AND METHODS FOR THE IN-LINE MEASUREMENT OF ALKALI METAL-CONTAINING STRUCTURES AND ALKALI ION-CONTAINING STRUCTURES 审中-公开

    公开(公告)号：US20230160821A1

    公开(公告)日：2023-05-25

    申请号：US17982911

    申请日：2022-11-08

    Applicant: Applied Materials, Inc.

    Inventor： Subramanya P. HERLE

    IPC: G01N21/63 ,  G01N21/88

    CPC classification number: G01N21/63 ,  G01N21/88 ,  G01N2201/125 ,  G01N2021/8416

    Abstract: Embodiments of the present disclosure generally relate to systems and methods for in-line measurement of alkali metal-containing structures or alkali ion-containing structures of, e.g., electrodes. In an embodiment, a system for processing an electrode is provided. The system includes a first processing chamber for forming an electrode comprising an alkali metal-containing structure. The system further includes a metrology station coupled to and in-line with the first processing chamber, the metrology station comprising: a source of radiation for delivering radiation to the alkali metal-containing structure, and an optical detector for receiving an emission of radiation emitted from the alkali metal-containing structure, and a processor configured to determine a characteristic of the alkali metal-containing structure of the electrode based on the emission of radiation.

    Open scattered light smoke detector and testing device for an open scattered light smoke detector of this type
    52.
    发明授权
    Open scattered light smoke detector and testing device for an open scattered light smoke detector of this type 有权

    公开(公告)号：US09905102B2

    公开(公告)日：2018-02-27

    申请号：US15148072

    申请日：2016-05-06

    Applicant: Siemens Schweiz AG

    Inventor： Martin Fischer

    IPC: G08B17/10 ,  G08B17/107 ,  G08B29/14 ,  G01J1/42 ,  G01N21/53

    CPC classification number: G08B17/107 ,  G01J1/42 ,  G01J2001/4242 ,  G01N21/53 ,  G01N2201/125 ,  G08B29/145

    Abstract: An open scattered light smoke detector for detecting smoke may include a light transmitter for emitting light, a light receiver spectrally matched to the light transmitter, and a control unit configured to repeatedly actuate the light transmitter, with a pulsed signal sequence, to emit corresponding light pulses, evaluate temporally a signal sequence received by the light receiver, and output a fire alarm if a received signal strength exceeds a minimum value for the smoke concentration. The control unit may be configured to switch the detector from a normal operating mode into a service mode if a phase angle between an emitted and received signal sequence, as determined on the detector side, increases by a minimum angular value which, in terms of the travel time, corresponds technically to an increase in the optical path length from the light transmitter to the light receiver of more than some predefined distance.

    APPARATUS FOR ACQUIRING AND PROJECTING BROADBAND IMAGE CAPABLE OF IMPLEMENTING VISIBLE LIGHT OPTICAL IMAGE AND INVISIBLE LIGHT FLUORESCENCE IMAGE TOGETHER
    56.
    发明申请
    APPARATUS FOR ACQUIRING AND PROJECTING BROADBAND IMAGE CAPABLE OF IMPLEMENTING VISIBLE LIGHT OPTICAL IMAGE AND INVISIBLE LIGHT FLUORESCENCE IMAGE TOGETHER 有权
    用于获取和投影宽带图像的装置，可实现可见光光学图像和可见光荧光图像对比

    公开(公告)号：US20160277687A1

    公开(公告)日：2016-09-22

    申请号：US14400356

    申请日：2014-09-02

    Applicant: KOREA PHOTONICS TECHNOLOGY INSTITUTE

    Inventor： Byeong Il LEE ,  In Hee SHIN ,  Jae Seok PARK ,  Joo Beom EOM ,  Hyung Ju PARK ,  Seok Ki KIM

    IPC: H04N5/33 ,  H04N9/31 ,  A61B5/00 ,  H04N5/232

    CPC classification number: H04N5/332 ,  A61B5/0033 ,  A61B5/0059 ,  A61B5/0071 ,  A61B5/7225 ,  A61B5/7445 ,  G01N21/6456 ,  G01N2201/06113 ,  G01N2201/062 ,  G01N2201/125 ,  H04N5/23293 ,  H04N9/3179

    Abstract: Provided is an apparatus for acquiring and projecting a broadband image, the apparatus including: a probe unit provided, on a probe housing of the probe unit, with a white light source unit configured to emit white light for acquiring a visible light image to a subject, a fluorescence excitation light source unit configured to emit fluorescence excitation light for acquiring an invisible light fluorescence image, and an image acquisition unit configured to receive an invisible light fluorescence image signal for the subject, and an image projection unit configured to project an image onto the subject; and an image processing unit configured to process an image received from the image acquisition unit. According to the apparatus for acquiring and projecting a broadband image, the visible light image and the invisible light fluorescence image may be simultaneously acquired and then displayed, and the acquired fluorescence image is projected onto a position where a fluorescence signal may be revealed, thus visually providing a position and shape in which the fluorescence signal is generated.

    Abstract translation: 本发明提供了一种用于获取和投影宽带图像的装置，该装置包括：探针单元，其设置在探针单元的探针外壳上，该白色光源单元被配置为发射白光以获得可见光图像到被摄体 荧光激发光源单元，被配置为发射用于获取不可见光荧光图像的荧光激发光;以及图像获取单元，被配置为接收对象的不可见光荧光图像信号，以及图像投影单元，被配置为将图像投影到 主题; 以及图像处理单元，被配置为处理从图像获取单元接收的图像。 根据用于获取和投影宽带图像的装置，可以同时获取可见光图像和不可见光荧光图像，然后显示，并将所获取的荧光图像投影到可以显示荧光信号的位置，因此目视 提供产生荧光信号的位置和形状。

    X-Ray Analyzer
    58.
    发明申请
    X-Ray Analyzer 有权
    X射线分析仪

    公开(公告)号：US20150268179A1

    公开(公告)日：2015-09-24

    申请号：US14611668

    申请日：2015-02-02

    Applicant: Hitachi High-Tech Science Corporation

    Inventor： Masahiro Sakuta

    IPC: G01N23/223 ,  G01N23/04

    CPC classification number: G01N23/223 ,  G01N2201/103 ,  G01N2201/125 ,  G01N2223/076 ,  G01N2223/304 ,  G01N2223/306 ,  G01N2223/408 ,  G01N2223/427 ,  G06F1/1692 ,  G06F3/017 ,  G06F3/03547 ,  G06F3/03548 ,  G06F3/0416 ,  G06F3/0484 ,  G06F3/04842 ,  G06F3/04845 ,  G06F3/04847 ,  G06F2203/04104

    Abstract: An X-ray analyzer includes a sample stage, an X-ray source that irradiates a sample with primary X-rays, a detector that detects secondary X-rays generated from the sample, a position adjustment mechanism that adjusts relative positions of the sample stage and the primary X-rays, an observation mechanism that obtains an observation image of the sample, and a computer having a display unit and an input unit. The computer has a function of, in response to a pointer being moved from a central region of the observation screen to a certain position by dragging the input unit with keeping a holding state, moving the sample stage in a movement direction and at a movement speed corresponding to a direction and a distance of the certain position relative to the central region.

    Abstract translation: X射线分析装置包括：样本台，对原样X射线照射样本的X射线源;检测从样本产生的二次X射线的检测器;调整样品台的相对位置的位置调整机构; 和主X射线，获取样本的观察图像的观察机构，以及具有显示单元和输入单元的计算机。 计算机具有响应于通过在保持保持状态下拖动输入单元而将指示器从观察屏幕的中心区域移动到特定位置的功能，使移动方向和移动速度移动样本台 对应于该位置相对于中心区域的方向和距离。

Patent Agency Ranking