Abstract:
A method of verifying data matrix print quality (2) utilizing center offset (7) for dot pen or inkjet marks, and size offset for laser etched or printed marks. The method of the present invention builds on the AIM specification and provides additional measures (3) to determine the quality of the data matrix marks. Center offset and size offset measurements (11) are employed to determine the data matrix quality.
Abstract:
A system and method are disclosed for highly efficient imaging of selected object features utilizing, in combination, a 2D imaging subsystem (100) and a 3D imaging subsystem (110) wherein data from the 2D imaging subsystem (100) is used to predetermine areas containing 3D features of interest such that delay attributable to imaging of areas of non-interest for 3D features is minimized.
Abstract:
A system and method for correcting a scan pattern of a moving optical scanning system (110) that scans an object or pattern (130). A gantry (120) moves the optical system at a constant rate in a first direction. Using a light source and a first deflector, the scanning system quickly sweeps a light beam in a direction orthogonal to the motion of the gantry (120) by changing the angle of deflection of the first deflector linearly with time. To compensate for the gantry motion, the optical system includes a second deflector that deflects the light at a deflection angle determined as a function of the velocity of the gantry. The deflected light is focused on the object or pattern. Accordingly, the object or pattern is scanned along a corrected scan line orthogonal to first direction. The optical scanning system may also perform 'selected' scanning and 'look ahead/look behind' scanning.
Abstract:
A chromatic optical ranging sensor, comprising:
means for focusing a source beam (30) of optical energy onto a target (6) from a known location, whereby different wavelengths of said source beam are focused at different distances from said known location; means for collecting a reflected beam from said target (6); means for detecting and interpolating said reflected beam to determine a distance of said target from said known location, means for separating said reflected beam into a focused portion and a unfocused portion; and means for determining a ratio of an amplitude of said focused portion to an amplitude of said unfocused portion.
Abstract:
A system is provided that simultaneously gathers three-dimensional and two-dimensional data for use in inspecting objects such as chip carriers for defects. Specifically, a source laser beam (303) is directed to an object and forms a spot (305) at the point of impingement at a known X-Y position on the object. The laser beam is reflected at the spot and light reflected off-axially (306, 307) with respect to the source laser beam (303) is detected by two position sensing detectors (PSDs) (310, 311). Simultaneous to detecting off-axially reflected light, retro-reflected light (i.e., the light reflected approximately co-axial with the source laser) is detected by a photo diode array (313). Three dimensional object information is determined from the position sensing detector (310, 311) signals and two-dimensional object information is determined from the photo diode array (313) signal.