METHOD FOR DATA MATRIX PRINT QUALITY VERIFICATION
    62.
    发明公开
    METHOD FOR DATA MATRIX PRINT QUALITY VERIFICATION 审中-公开
    控制程序的印刷质量是数据矩阵

    公开(公告)号:EP1252022A1

    公开(公告)日:2002-10-30

    申请号:EP01942598.2

    申请日:2001-01-22

    CPC classification number: B41J29/393 G06K5/00

    Abstract: A method of verifying data matrix print quality (2) utilizing center offset (7) for dot pen or inkjet marks, and size offset for laser etched or printed marks. The method of the present invention builds on the AIM specification and provides additional measures (3) to determine the quality of the data matrix marks. Center offset and size offset measurements (11) are employed to determine the data matrix quality.

    SYSTEM AND METHOD FOR SELECTIVE SCANNING OF AN OBJECT OR PATTERN INCLUDING SCAN CORRECTION
    64.
    发明公开
    SYSTEM AND METHOD FOR SELECTIVE SCANNING OF AN OBJECT OR PATTERN INCLUDING SCAN CORRECTION 审中-公开
    系统和方法选择性扫描对象或图案扫描校正

    公开(公告)号:EP1060432A1

    公开(公告)日:2000-12-20

    申请号:EP99905800.1

    申请日:1999-02-05

    CPC classification number: G01B11/00 G01N21/88 G02B26/10

    Abstract: A system and method for correcting a scan pattern of a moving optical scanning system (110) that scans an object or pattern (130). A gantry (120) moves the optical system at a constant rate in a first direction. Using a light source and a first deflector, the scanning system quickly sweeps a light beam in a direction orthogonal to the motion of the gantry (120) by changing the angle of deflection of the first deflector linearly with time. To compensate for the gantry motion, the optical system includes a second deflector that deflects the light at a deflection angle determined as a function of the velocity of the gantry. The deflected light is focused on the object or pattern. Accordingly, the object or pattern is scanned along a corrected scan line orthogonal to first direction. The optical scanning system may also perform 'selected' scanning and 'look ahead/look behind' scanning.

    Chromatic optical ranging sensor
    66.
    发明公开
    Chromatic optical ranging sensor 失效
    Chromatischer optischer传感器zum Entfernungsmessen

    公开(公告)号:EP0997748A2

    公开(公告)日:2000-05-03

    申请号:EP99126196.7

    申请日:1996-07-20

    Abstract: A chromatic optical ranging sensor, comprising:

    means for focusing a source beam (30) of optical energy onto a target (6) from a known location, whereby different wavelengths of said source beam are focused at different distances from said known location;
    means for collecting a reflected beam from said target (6);
    means for detecting and interpolating said reflected beam to determine a distance of said target from said known location,
    means for separating said reflected beam into a focused portion and a unfocused portion; and
    means for determining a ratio of an amplitude of said focused portion to an amplitude of said unfocused portion.

    Abstract translation: 一种彩色光学测距传感器,包括:用于将光能源(30)从已知位置聚焦到目标(6)上的装置,由此所述源光束的不同波长聚焦在与所述已知位置不同的距离处; 用于从所述目标(6)收集反射光束的装置; 用于检测和内插所述反射光束以确定所述目标与所述已知位置的距离的装置,用于将所述反射光束分离成聚焦部分和未聚焦部分的装置; 以及用于确定所述聚焦部分的幅度与所述未聚焦部分的幅度之比的装置。

    METHOD AND SYSTEM FOR MEASURING OBJECT FEATURES
    67.
    发明公开
    METHOD AND SYSTEM FOR MEASURING OBJECT FEATURES 失效
    用于测量对象特征的方法和系统

    公开(公告)号:EP0979386A1

    公开(公告)日:2000-02-16

    申请号:EP97931329.3

    申请日:1997-06-19

    CPC classification number: G01B11/002

    Abstract: A system is provided that simultaneously gathers three-dimensional and two-dimensional data for use in inspecting objects such as chip carriers for defects. Specifically, a source laser beam (303) is directed to an object and forms a spot (305) at the point of impingement at a known X-Y position on the object. The laser beam is reflected at the spot and light reflected off-axially (306, 307) with respect to the source laser beam (303) is detected by two position sensing detectors (PSDs) (310, 311). Simultaneous to detecting off-axially reflected light, retro-reflected light (i.e., the light reflected approximately co-axial with the source laser) is detected by a photo diode array (313). Three dimensional object information is determined from the position sensing detector (310, 311) signals and two-dimensional object information is determined from the photo diode array (313) signal.

    Abstract translation: 提供了一种系统,其同时收集三维和二维数据以用于检查诸如芯片载体的物体的缺陷。 具体而言,源激光束(303)被引导至物体并且在物体上的已知X-Y位置处的撞击点处形成点(305)。 激光束在该点反射,并且由两个位置感测检测器(PSD)(310,311)检测相对于源激光束(303)轴向(306,307)反射的光。 在检测离轴反射光的同时,由光电二极管阵列(313)检测回射光(即与源激光器近似同轴反射的光)。 根据位置感测检测器(310,311)信号确定三维物体信息,并且从光电二极管阵列(313)信号确定二维物体信息。

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