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    COLD CATHODE ELEMENT AND ITS MANUFACTURE
    61.
    发明专利
    COLD CATHODE ELEMENT AND ITS MANUFACTURE 失效

    公开(公告)号：JPH06223706A

    公开(公告)日：1994-08-12

    申请号：JP963193

    申请日：1993-01-25

    Applicant: NEC CORP

    Inventor： MAKISHIMA HIDEO ,  YAMADA KEIZO ,  TOMIHARI YOSHINORI

    IPC: H01J1/304 ,  H01J3/02 ,  H01J3/14 ,  H01J3/18 ,  H01J9/02 ,  H01J23/04 ,  H01J29/04 ,  H01J37/073 ,  H01J1/30

    Abstract: PURPOSE:To realize a cold cathode in which the structure is simple, the assembly is simple, the accuracy is high, and a small size electron gun can be composed. CONSTITUTION:An opening common to a minute cold cathode group 12 is provided on the first insulating layer 8 to compose the minute cold cathode group 12, and a gate electrode 9, and the second insulator 11 thicker than the first insulating layer 8, and a metallic layer 2 are formed. As a result, an electron beam 6 is formed from the electrons discharged from the numerous minute cold cathodes 12. In order to manufacture the cathode 5, a cold cathode chip 3 including the gate electrode 9, and a composition composed of the thick insulator 11 and the metallic layer 2 are produced separately, and then the positions of both members are fitted with high accuracy and integrated so as to make into a part.

    METHOD AND INTERACTION DEVICE FOR ACCURATELY MEASURING PARAMETER OF SURFACE OTHER THAN SHAPE OR FOR PERFORMING WORK ASSOCIATED WITH SHAPE
    62.
    发明专利
    METHOD AND INTERACTION DEVICE FOR ACCURATELY MEASURING PARAMETER OF SURFACE OTHER THAN SHAPE OR FOR PERFORMING WORK ASSOCIATED WITH SHAPE 失效

    公开(公告)号：JPH06213910A

    公开(公告)日：1994-08-05

    申请号：JP29845493

    申请日：1993-11-29

    Applicant: DIGITAL INSTR INC

    Inventor： BAAJIRU BII ERINGUSU ,  JIYON EI GAARII

    IPC: G01N37/00 ,  G01B7/00 ,  G01B7/34 ,  G01B21/30 ,  G01N27/00 ,  G01Q10/04 ,  G01Q10/06 ,  G01Q40/00 ,  G01Q60/00 ,  G11B9/14 ,  H01J3/14 ,  H01J37/28

    Abstract: PURPOSE: To cope with extensive application by storing the surface shape of a sample with a position sensor, accurately positioning a probe on the surface with shape information, and measuring the surface characteristics other than the shape. CONSTITUTION: A detector 104 detects the surface shape of a sample 102 and generates the signal applied to a signal processor 106 according to the type of a scanning probe type microscope to be used. The output from the signal processor 106 displaying the X, Y-positions and the Z-position of a probe 100 or the sample 102 is stored in a memory 114. The stored shape data are fed to the signal processor 106 as the input signal during the scanning of the surface of the sample 102. A position control device 108 is controlled by the shape data, the tip of the probe 100 is located at the desired X, Y, Z-positions for the known surface shape, the prescribed surface characteristics other than the shape are measured, or the prescribed work is conducted. The tip of the probe 100 conducts other measurement by a scanning probe device via the detector 104.

    63.
    发明专利
    失效

    公开(公告)号：JPS5015666B1

    公开(公告)日：1975-06-06

    申请号：JP8416170

    申请日：1970-09-28

    IPC: G01R33/02 ,  G01R33/028 ,  H01J3/14

    Confocal laser scanning microscope
    66.
    发明专利
    Confocal laser scanning microscope 有权
    共焦激光扫描显微镜

    公开(公告)号：JP2011118427A

    公开(公告)日：2011-06-16

    申请号：JP2011049400

    申请日：2011-03-07

    Applicant: Olympus Corp ,  オリンパス株式会社

    Inventor： KITAHARA AKIHIRO

    IPC: G02B21/06 ,  G02B21/00 ,  G02B21/36 ,  H01J3/14

    CPC classification number: G02B21/0024 ,  G02B21/365

    Abstract: PROBLEM TO BE SOLVED: To enable switching of at least two of the observation methods in an optical microscope system for e.g. bright field observation, dark field observation, and differential interference observation.
    SOLUTION: A confocal laser scanning microscope for acquiring a confocal image of a sample includes: a laser optical system which acquires a confocal image of the sample; an optical microscope optical system which detects measurement light from the sample to acquire a non-confocal image of the sample; a first field lens arranged in the optical microscope optical system; and a second field lens arranged in the laser optical system. The first and second field lenses shorten back focal lengths for forming the non-confocal image and confocal image.
    COPYRIGHT: (C)2011,JPO&INPIT

    Abstract translation: 要解决的问题：为了能够在例如光学显微镜系统中切换至少两种观察方法。 明场观察，暗视场观测和微分干涉观测。 解决方案：用于获取样品的共焦图像的共焦激光扫描显微镜包括：获取样品的共聚焦图像的激光光学系统; 光学显微镜光学系统，其检测来自样品的测量光以获取样品的非共焦图像; 布置在光学显微镜光学系统中的第一场透镜; 以及布置在激光光学系统中的第二场透镜。 第一和第二场透镜缩短形成非共焦图像和共聚焦图像的焦距。 版权所有（C）2011，JPO＆INPIT

    Image reading device
    67.
    发明专利
    Image reading device 有权

    公开(公告)号：JP4345403B2

    公开(公告)日：2009-10-14

    申请号：JP2003297659

    申请日：2003-08-21

    Applicant: セイコーエプソン株式会社

    Inventor： 敦之 今泉 ,  洋昭 春日

    IPC: G06T1/00 ,  H04N1/028 ,  H01J3/14 ,  H04N1/04 ,  H04N1/407 ,  H04N1/48

    CPC classification number: H04N1/0464 ,  H04N1/407 ,  H04N1/486

    Abstract: An image scanning apparatus comprising a plurality of image scanning sensors 21, 31, 41, and a CIS control chip 50 for controlling these image scanning sensors 21, 31, 41. The CIS control chip 50 has a trigger generator 54 for controlling operation of the image scanning sensors 21, 31, 41, a lamp control circuit 55, and a motor control circuit 56. The CIS control chip 50 also has an AFE 51 having a plurality of input terminals 51a to 51c for receiving the analog image signals from the first scanning sensor 21, second scanning sensor 31, and third scanning sensor 41, respectively and a gain/offset control circuit for adjusting the gain and offset of each line of analog data supplied from the image scanning sensors 21, 31, 41.

    Scanning optical system
    68.
    发明专利
    Scanning optical system 有权

    公开(公告)号：JP4293780B2

    公开(公告)日：2009-07-08

    申请号：JP2002346973

    申请日：2002-11-29

    Applicant: Hoya株式会社

    Inventor： 豊 高窪

    IPC: B41J2/44 ,  G02B26/10 ,  G02B26/08 ,  G02B26/12 ,  H01J3/14 ,  H01J5/16 ,  H04N1/113

    CPC classification number: G02B26/125 ,  G02B26/124

    Abstract: There is provided a scanning optical system which includes a light source, a line-like image forming optical system, a polygonal mirror, and an imaging optical system. The line-like image forming optical system forms a line-like image extending in the main scanning direction in the vicinity of a reflective surface of the polygonal mirror, and if the number of reflective surfaces of the polygonal mirror is less than or equal to six and if |m|>1.85, the following condition (1) is satisfied: r where r represents a radius of an inscribed circle of the polygonal mirror, m represents a lateral magnification of the imaging optical system in the auxiliary scanning direction, f represents a focal length of the imaging optical system in the main scanning direction, and w represents half of a scanning width.

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