公开(公告)号：DE10313987B4

公开(公告)日：2007-07-12

申请号：DE10313987

申请日：2003-03-27

Applicant: LEICA MICROSYSTEMS

Inventor： SEYFRIED VOLKER

IPC: G02B21/06 ,  G02B6/00 ,  G02B6/02 ,  G02B6/42

公开(公告)号：DE102006000976A1

公开(公告)日：2007-07-12

申请号：DE102006000976

申请日：2006-01-07

Applicant: LEICA MICROSYSTEMS

Inventor： SEYFRIED VOLKER ,  SCHREIBER FRANK

IPC: G01J1/10 ,  G02B21/00 ,  H01L27/148

Abstract: The device has a reference light source (30) e.g. LED, that directs light to a part of a photosensor-chip (19). A controlling and/or regulating unit determines and correlates variances of light-sensitive units that are illuminated by the reference light source. The light source defines a reference optical path that is partially identical to a detection optical path of the photosensor-chip. Independent claims are also included for the following: (1) a microscope with a light source (2) a method for calibrating a photosensor-chip.

公开(公告)号：DE102005042890B4

公开(公告)日：2007-05-31

申请号：DE102005042890

申请日：2005-09-09

Applicant: LEICA MICROSYSTEMS

Inventor： SEYFRIED VOLKER ,  SCHREIBER FRANK

IPC: G02B21/00 ,  G01B11/14 ,  G01B11/24

Abstract: The invention relates to a confocal microscope which illuminates a sample (15) by means of at least one light source. A detection light beam (17) is emitted from the sample (15). The detection light beam (17) is spectrally split up in a spatial manner by the dispersive element (20) and subsequently formed on a photosensor chip (19) by means of a detection optical system (22). At least one expanding optical system (23) is arranged in front of the dispersive element (20) in the direction of the detection light beam (17). The expanding optical system (23) is embodied in such a manner that the numerical aperture of the detection optical system (22) is independent from the numerical aperture of the detection light beam (17) on the detection apertured diaphragm (18).

公开(公告)号：DE102005042672A1

公开(公告)日：2007-03-15

申请号：DE102005042672

申请日：2005-09-08

Applicant: LEICA MICROSYSTEMS

Inventor： SCHREIBER FRANK ,  SEYFRIED VOLKER

IPC: H01L27/146 ,  H04N5/335

Abstract: A photosensor chip includes a light-sensitive region with a plurality of detector elements and a light-insensitive region including a buffer memory. The light-insensitive region is at least double the light-sensitive region. A charge produced at different points in time in the detector elements is successively transferred into the buffer memory for being subsequently read out by a read-out register from the buffer memory. In one embodiment, the buffer memory includes a first and second buffer memory adjoining corresponding sides of the light-sensitive region. The first and second buffer memory can be used alternatively for buffer-storage and read-out.

公开(公告)号：DE10357584B4

公开(公告)日：2006-06-14

申请号：DE10357584

申请日：2003-12-08

Applicant: LEICA MICROSYSTEMS

Inventor： SEYFRIED VOLKER ,  STORZ RAFAEL

IPC: G02B21/00 ,  G02B21/06 ,  G01J3/44 ,  G02B21/16

Abstract: Separating different emission wavelengths in a scanning microscope, is new. Separating different emission wavelengths in a scanning microscope comprises: (a) scanning a specimen with an illuminating light beam by passing the illuminating light beam over the specimen using a beam deflector; (b) selectively applying each of excitation wavelengths (1, 2, 3) to the illuminating light beam during the scanning according to a pre-definable illumination scheme; (c) detecting emission light coming from the specimen using detector(s), where the detector is read out upon each selective applying of a respective excitation wavelength to provide respective corresponding detected signals; and (d) associating the detected signals with the respective excitation wavelength using the illumination scheme. The emission light includes emission wavelengths corresponding to the excitation wavelengths. An independent claim is also included for an apparatus for separating different emission wavelengths in a scanning microscope, comprising: (a) light source(s) configured to generate an illuminating light beam; (b) a beam deflector configured to scan a specimen with the illuminating light beam by passing the illuminating light beam over the specimen; (c) a light control device configured to selectively apply each of excitation wavelengths to the illuminating light beam during a scanning according to a pre-definable illumination scheme; (d) detector(s) configured to pick up emission light coming from the specimen; and (e) a processing device configured to associate the detected signals with the respective excitation wavelengths using the illumination scheme.

公开(公告)号：DE102004031048A1

公开(公告)日：2006-01-12

申请号：DE102004031048

申请日：2004-06-25

Applicant: LEICA MICROSYSTEMS

Inventor： KNEBEL WERNER ,  SEYFRIED VOLKER ,  SCHROEDER JAN

IPC: G02B21/00 ,  G02B21/06 ,  G02B21/16

Abstract: A microscope includes at least one illuminating light source and an illumination beam path for guiding the illuminating light to a specimen. A detection beam path guides detected light from the specimen to a detector. An activatable element is positioned in the detection beam path for regulating and/or limiting the light power level in the detection beam path.

公开(公告)号：DE10340020B4

公开(公告)日：2005-08-11

申请号：DE10340020

申请日：2003-08-28

Applicant: LEICA MICROSYSTEMS

Inventor： BIRK HOLGER ,  SEYFRIED VOLKER ,  STORZ RAFAEL

IPC: G01J3/14 ,  G01J3/28 ,  G01J3/36 ,  G01J3/44 ,  G01N21/64 ,  G02B21/00 ,  G01J3/02

公开(公告)号：DE10313988A1

公开(公告)日：2004-10-14

申请号：DE10313988

申请日：2003-03-27

Applicant: LEICA MICROSYSTEMS

Inventor： SEYFRIED VOLKER ,  STORZ RAFAEL

IPC: G02B21/00 ,  G01M11/02

Abstract: The microscope is tested using a phosphorescent probe (5). The probe is thermally stimulated until phosphorescent saturation. Light emitted from the probe is detected by a detector (7) and the detected signal is evaluated and compared with known data.

公开(公告)号：DE10247247A1

公开(公告)日：2004-04-22

申请号：DE10247247

申请日：2002-10-10

Applicant: LEICA MICROSYSTEMS

Inventor： SEYFRIED VOLKER

IPC: G01J3/12 ,  G02B21/00 ,  G02B27/28 ,  G02B21/06

Abstract: An optical arrangement for directing illumination light to a sample and for directing the detection light proceeding from the sample to a detector has a spectrally selective influencing means in the beam path of the detection light, which influences the polarization properties of the illumination light reflected or scattered from the sample in such a way that a polarizing beam splitter splits the illumination light reflected or scattered from the sample out of the detection light.

公开(公告)号：DE10228374A1

公开(公告)日：2004-01-15

申请号：DE10228374

申请日：2002-06-25

Applicant: LEICA MICROSYSTEMS

Inventor： SEYFRIED VOLKER

IPC: G01J3/12 ,  G01N21/64 ,  G02B21/00 ,  G01N21/62

Abstract: A method for microscopy includes generating pulsed illuminating light including wavelengths in a spectral region. A detection spectral region within the spectral region is defined. Using a dynamically controllable mask, light components of the illuminating light that comprise wavelengths within the detection spectral region are influenced. A specimen is illuminated with the influenced illuminating light. Detection light proceeding from the specimen within the detection spectral region is detected.