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    84.
    发明专利
    未知

    公开(公告)号：DE1539660A1

    公开(公告)日：1970-04-09

    申请号：DEA0053728

    申请日：1966-10-11

    Applicant: APPLIED RES LAB INC

    Inventor： JAKOB LIEBL HELMUT

    IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32 ,  H01J39/34

    Abstract: 1,145,107. Ion beam tubes; particle spectrometers. APPLIED RESEARCH LABORATORIES Inc. 4 Oct., 1966 [11 Oct., 1965(3)], No. 44183/66. Heading H1D. An ion beam microprobe analyzer has a wedgeshaped magnetic lens 116 for filtering out undesired ions and a unipotential electrostatic lens 118 for concentrating the beam directed on to the specimen 124. An additional concentrating unipotential lens 122 may be provided and the beam is scanned over a selected area of the specimen by pairs of deflection plates 126. Ions emitted from the specimen are directed into a double-focusing mass spectrometer 130 in which a unipotential lens 132 is provided in advance of the electrostatic analyser 134, as described in Specification 1,145,108, in order to increase the acceptance angle. An auxiliary pair of deflection plates 150 is provided at the entrance of the spectrometer in order to compensate for movement of the cross-over at the exit aperture 142 due to the effect of scanning the primary ion beam over the specimen. An electron gun 152 produces an electron beam for ionizing neutral particles emitted from the specimen and so to increase the effective ion emission from the specimen.

    85.
    发明专利
    未知

    公开(公告)号：DE1935975A1

    公开(公告)日：1970-01-22

    申请号：DE1935975

    申请日：1969-07-15

    Applicant: APPLIED RES LAB INC

    Inventor： NEUHAUS HERMANN

    IPC: H01J37/141 ,  H01J37/252 ,  H01J37/14

    Abstract: 1,225,579. Electron - beam apparatus. APPLIED RESEARCH LABORATORIES Inc. 17 July, 1969 [17 July, 1968], No. 36119/69. Heading HID. In order to remove contaminants from an electron microprobe of the kind having a lens positioned closely adjacent to the specimen, the lens structure is cooled to a temperature below about - 20‹ C. In the microprobe shown, an election beam impinges on a small area of the specimen 14 to cause emission of X-rays which are subjected to analysis. Contaminants are caused to condense on the surface 10 of a lens 12 which is cooled by means of a refrigerant circulated in a coil 24 surrounding the winding 16. A conventional refrigerant is used for temperatures down to- 40‹ C. and below this, liquid nitrogen is used. The coil 24 may be included in the cooling circuit of a diffusion pump for the apparatus and the temperature of the lens may be regulated by means of an adjustable valve in a by-pass circuit. The specimen 14 may be heated by means of a coil 27. Temperature sensors 26, 28 may be used in automatic regulating circuits for both cooling and heating.

    Peaked monochromator
    90.
    发明专利
    Peaked monochromator 未知

    公开(公告)号：GB1141612A

    公开(公告)日：1969-01-29

    申请号：GB1698366

    申请日：1966-04-18

    Applicant: APPLIED RES LAB INC

    IPC: G01J3/18 ,  G01J3/24 ,  G02B5/18 ,  G21K1/06

    Abstract: 1,141,612. X-Ray diffraction apparatus with blazed grating. APPLIED RESEARCH LABORATORIES Inc. 18 April, 1966 [21 April, 1965], No. 16983/66. Heading H5R. [Also in Division G2] In a spectrograph comprising a sharply blazed diffraction grating the input and output angles are so varied that for each wavelength of interest the condition for constructive interference is satisfied at the peak of the blaze. Where the grating is reflective this is accomplished by making the output angle differ from the input angle by twice the blaze angle of the grating or in a transmission grating, having a small blaze angle, by making the output angle differ from the input angle by approximately the product of the refractive index of the grating minus unity, times the blaze angle. When the radiation is of short wavelengths, such as in the soft X-ray region, additionally, the angle between the incident light and the reflecting facets of the grooves of the grating is kept smaller than the critical angle of total external reflection so that the grating highly discriminates against second and higher orders. As shown, Fig. 2, a bell crank 64 is pivoted at 70, 76, to define a chord of the Rowland circle 18, the centre of which lies at the apex 68 of the bell crank. The pivots 70, 76, slide in slots 72, 62, whose extensions would melt at 14 where the input slit is placed, the slots 72, 62 being inclined to each other at an angle equal to one half the apex angle of the bell crank 64. The grating 11, which has a radius of curvature twice that of the Rowland circle 18, fixed to the bell crank 64 at the pivot 76, the latter being moved along slot 62 by a screw 81 and nut 80. A parallelogram linkage 26, 27, 28, 29 has two arms 26, 27 pivoted together in line with the centre of grating 11, the arm 26 being fixed to nut 80 and held in alignment with screw 81, so that it is always at the input angle relative to grating 11. Arms 28, 29 have their common pivot 31 sliding in a guideway 69 in the outer end of arm 65 of the bell crank 64. The output slit 20 and detector 22 are mounted on a carriage 24 which is slidable along a guideway 34 and maintained on the Rowland circle 18 by a link 98 pivoted at the apex 68. The guideway 34 is pivoted on the pivot 76 and adjustably fixed to the arm 27, such as by the screw arrangement 36, so that the difference between the input and output angles is kept constant and made equal to twice the blaze angle of the grating 11.

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