Abstract:
A current generator circuit with controllable frequency response is of a type which comprises at least one current mirror formed of MOS transistors, being powered through a terminal held at a constant voltage, having an input leg through which a reference current (I1) is driven by a first current generator (G1), and having an output leg for generating, on an output terminal (OUT) of the mirror, a mirrored current (I out ) which is proportional to the reference current (I1). The input leg includes at least a first transistor (M1) which is diode-connected and has a control terminal (Ga1) coupled to a corresponding terminal (Ga2) of a second transistor (M2) included in the output leg. In accordance with the invention, the mirror circuit further comprises an impedance matching means (3) connected across the control terminals (Ga1 and Ga2) of the first and second transistors and configured to hold the same voltage value at both terminals (Ga1 and Ga2). The impedance matching means (3) has an adjustable output impedance, specifically lower in value than the value to be had without this means. It functions to regulate the impedance on the control node (Ga2) of the second transistor (M2). The invention is equally applicable to N-channel and P-channel MOS transistors. Advantageously, the reference current can be varied by an external signal which is a function of the output signal, to provide feedback regulating features.
Abstract:
The reading circuit described comprises, for each bit line (BL) of a matrix (11) of memory cells (12), a controllable switching element (To) which can connect the bit line (BL) to a voltage source (V DD ) in response to a control signal applied to a control terminal thereof, a detector stage (16) sensitive to the flow of current through the bit line (BL), and a driving stage (15) comprising two field-effect transistors (TNB, TPB) connected in the inverter configuration with the input of the inverter connected to the bit line (BL) and with the output (CAS) of the inverter connected to the control terminal of the controllable switching element (To). In order to charge the capacitance (C BL ) associated with the bit line rapidly but without causing oscillatory phenomena, the driving stage (15) comprises means (Tnat, Tas) for reducing the gain of the feedback loop formed by the inverter (TNB, TPB) and by the controllable switching element (To).
Abstract:
A pixel emission current limiting resistance is realized by forming a stack of alternately doped amorphous or polycrystalline silicon layers over the cathodic conductors of a FED driving matrix. The stack of amorphous or polycrystalline silicon layers doped alternately n and p provides at least a reversely biased n/p junction having a leakage current that matches the required level of pixel emission current. The reversely biased junction constitutes a nonlinear series resistance that is quite effective in limiting the emission current through anyone of the microtips that form an individually excitable pixel and which are formed on the uppermost layer of the stack.
Abstract:
An amplifier (70) is formed by an astable multivibrator (2) having a signal output (15, 19) supplying a two-state output signal to a power stage (3), the output (35) of which presents an output voltage (V o ) switching between a first and second value; the output voltage presents a duty cycle varying with the input signal (V in ) of the multivibrator. The amplifier (70) is connected between a first and second supply line (V cc , -V cc ) symmetrical with respect to ground (13) and subject to supply noise ( ΔV), and comprises a current source (71) for generating the bias current of the astable multivibrator and supplying a current (I) switchable at each half cycle; the value of the current at each half cycle being proportional to the absolute value of the output voltage (V o ) of the amplifier, so as to vary the duty cycle of the amplifier in a manner correlated with the supply noise, so that the average output voltage value is zero.
Abstract:
A method for setting the threshold voltage of a reference memory cell (RMC) of a memory device is described, the reference memory cell (RMC) being used as a reference current generator for generating a reference current which is compared by a sensing circuit (1,2,3) of the memory device with currents sunk by memory cells to be sensed, belonging to a memory matrix (MM) of the memory device. The method comprises a first step in which the reference memory cell (RMC) is submitted to a change in its threshold voltage, and a second step in which the threshold voltage of the reference memory cell (RMC) is verified. The second step provides for performing a sensing of the reference memory cell (RMC) using a memory cell (MC) with known threshold voltage (V TUV ) belonging to the memory matrix (MM) as a reference current generator for generating a current (IC) which is compared by the sensing circuit (1,2,3) with the current (IR) sunk by the reference memory cell (RMC).
Abstract:
The high-pass filter described comprises at least one circuit unit constituted by a first branch (A) and a second branch (B) both connected to an input (IN) of the filter on one side and, on the other side, to an adder (OP) the output of which is the output (OUT) of the filter. The first branch (A) comprises means (Rff) for transferring an input signal substantially without modifying its frequency content, and the second branch (B) comprises a low-pass filter (Rsc, C'fil). The whole is of dimensions such that the components of the input signal with frequencies below the cut-off frequency of the low-pass filter are substantially cancelled out at the output of the adder. The filter is suitable for being produced within a particularly small area in an integrated circuit.