TERAHERTZ WAVE MEASURING DEVICE AND MEASURING METHOD

    公开(公告)号:EP3035033B1

    公开(公告)日:2018-06-13

    申请号:EP15200071.7

    申请日:2015-12-15

    Applicant: ARKRAY, Inc.

    Inventor: UCHIDA, Hirohisa

    Abstract: There is provided a terahertz wave measuring device including (1) a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size, (2) a structural body through which the terahertz wave is transmitted; and (3) a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.

    TERAHERTZ WAVE MEASURING DEVICE, MEASURING METHOD, AND MEASURING RIG
    82.
    发明公开
    TERAHERTZ WAVE MEASURING DEVICE, MEASURING METHOD, AND MEASURING RIG 有权
    TERAHERTZ-WELLEN-MESSVORRICHTUNG,MESSVERFAHREN UNDMESSAUSRÜSTUNG

    公开(公告)号:EP3035033A1

    公开(公告)日:2016-06-22

    申请号:EP15200071.7

    申请日:2015-12-15

    Applicant: ARKRAY, Inc.

    Inventor: UCHIDA, Hirohisa

    Abstract: There is provided a terahertz wave measuring device including (1) a terahertz wave generation element that generates a terahertz wave by difference frequency generation based on excitation light that is incident to the terahertz wave generation element, the excitation light including a plurality of different wavelength components and being condensed so as to have a beam diameter of a predetermined size, (2) a structural body through which the terahertz wave is transmitted; and (3) a detector that detects an intensity of the terahertz wave that has been transmitted through the structural body, wherein the structural body includes a sample holder of a predetermined width that holds a sample, and the structural body is in close contact with or is joined to the terahertz wave generation element.

    Abstract translation: 提供了一种太赫兹波测量装置,其包括:(1)太赫兹波发生元件,其通过基于入射到太赫兹波发生元件的激发光产生差频产生太赫兹波,所述激发光包括多个不同波长成分 并被凝聚成具有预定尺寸的光束直径;(2)太赫兹波被透射的结构体; (3)检测已经透过结构体的太赫兹波的强度的检测器,其中结构体包括保持样品的预定宽度的样品保持器,并且结构体紧密接触或 被连接到太赫兹波发生元件。

    APPARATUS AND METHOD FOR CHARACTERIZING A LIGHT SOURCE
    84.
    发明公开
    APPARATUS AND METHOD FOR CHARACTERIZING A LIGHT SOURCE 审中-公开
    装置和方法用于表征光源

    公开(公告)号:EP2041536A1

    公开(公告)日:2009-04-01

    申请号:EP07720063.2

    申请日:2007-07-06

    Abstract: The present invention provides an apparatus and method for characterizing the photometric and/or colourmetric properties of a light source. The apparatus comprises a detector system which generates data indicative of at least spectroradiometric data for at least a portion of the light emitted by the light source. The apparatus further comprises a manipulation stage configured to control the relative position between the detector system and the light source. In addition, the apparatus comprises a control and processing system configured to control operation of the detector system, operation of the manipulation stage and record the data and the relative position of the detector system associated therewith. The control and processing system is further configured to process the collected data for determination of the photometric and/or colourmetric properties of the light emitted by the light source.

    Brightness measurement apparatus
    85.
    发明公开
    Brightness measurement apparatus 审中-公开
    Helligkeitsmessvorrichtung

    公开(公告)号:EP1791372A1

    公开(公告)日:2007-05-30

    申请号:EP06024209.6

    申请日:2006-11-22

    Inventor: Oka, Masaharu

    CPC classification number: G01J1/04 G01J1/0223 G01J1/0403 G01J3/02 G02F1/1309

    Abstract: A brightness measurement apparatus which includes a placement unit on which an object to be measured is placed, a measurement unit for measuring brightness or chromaticity from an upper surface of the object placed on the placement unit, a placement unit moving mechanism for moving the placement unit in an x-axis direction, and a measurement unit moving mechanism for moving the measurement unit in a γ-axis direction orthogonal to the x-axis direction.

    Abstract translation: 一种亮度测量装置,包括放置有待测对象的放置单元,从放置在放置单元上的被摄体的上表面测量亮度或色度的测量单元,用于移动放置单元的放置单元移动机构 以及用于使测量单元沿与x轴方向正交的³轴方向移动的测量单元移动机构。

    METHOD AND APPARATUS FOR LUMINAIRE CHARACTERIZATION
    86.
    发明公开
    METHOD AND APPARATUS FOR LUMINAIRE CHARACTERIZATION 审中-公开
    VERFAHREN UND VORRICHTUNG ZUR CHARAKTERISIERUNG EINER LEUCHTE

    公开(公告)号:EP3108720A1

    公开(公告)日:2016-12-28

    申请号:EP15711923.1

    申请日:2015-02-26

    Inventor: BARNARD, Chris

    CPC classification number: G01J1/4228 G01J1/0223 G01J1/0242 G01J2001/4247

    Abstract: A method and associated apparatus are disclosed for measuring illumination characteristics of a luminaire having unknown characteristics. The method includes steps of providing an array of calibrated photodetectors in known locations in proximity to a mounting location, and then illuminating the array with a luminaire having unknown illumination properties. The resulting data is used to calculate the luminous intensity vs. angle from the luminaire and the luminous flux of the luminaire. Methods of calibrating the measurement with a known luminaire are presented along with methods of determining the angular position of the detectors in the array. Color-sensitive detectors can be used to determine the angular distribution and average value of the luminaire's correlated color temperature.

    Abstract translation: 公开了一种用于测量具有未知特性的照明器的照明特性的方法和相关装置。 该方法包括在靠近安装位置的已知位置提供校准光电检测器阵列的步骤,然后用具有未知照明特性的照明器照亮阵列。 得到的数据用于计算照明器的发光强度与角度的关系以及灯具的光通量。 与已知照明器校准测量的方法一起提供确定阵列中的检测器的角位置的方法。 颜色敏感检测器可用于确定灯具相关色温的角度分布和平均值。

    Highly sensitive electronic device for measuring extremely faint light emissions
    89.
    发明公开
    Highly sensitive electronic device for measuring extremely faint light emissions 失效
    用于测量极端亮度发射的高灵敏度电子设备

    公开(公告)号:EP0580141A3

    公开(公告)日:1995-09-13

    申请号:EP93111671.9

    申请日:1993-07-21

    Inventor: Motolese, Guido

    CPC classification number: G01J1/04 G01J1/0204 G01J1/0223 G01J1/044 G01N21/76

    Abstract: An electronic device for measuring extremely faint light emissions comprises a photomultiplier tube (1) surrounded by a sleeve (3) made of a material which is a good heat conductor, cooled to a low temperature and insulated from the outside, a thermally insulating and optically transparent lightguide body (5) being stably glued to the photocathode of the photomultiplier tube (1) to receive the light radiation emitted by a specimen (6) to be examined, which is inserted in a cavity (8a) of a supporting structure holding a rotary body (11) which can be turned in front of the lightguide body (5), so as to operate as a shutter for the lightguide in a first turned measurement position thereof to allow measurement of the dark signal and then allow, as the rotary body (11) and the specimen (6) held therein are turned to a second measurement position, to measure the light emission from the specimen (6).

    Abstract translation: 用于测量非常微弱的光发射的电子设备包括光电倍增管(1),该光电倍增管由套筒(3)围绕,套管(3)由良好导热体材料制成,被冷却至低温并与外部绝缘,隔热和光学 透明导光体(5)稳定地胶合到光电倍增管(1)的光电阴极上,以接收由待检查样本(6)发射的光辐射,其被插入到支撑结构的空腔(8a)中, 可以在光导体(5)的前方转动的旋转体(11),以便在第一转动测量位置作为光导的快门操作,以允许测量暗信号,然后允许作为旋转体 保持在其中的本体(11)和样品(6)转到第二测量位置,以测量来自样品(6)的光发射。

    Highly sensitive electronic device for measuring extremely faint light emissions
    90.
    发明公开
    Highly sensitive electronic device for measuring extremely faint light emissions 失效
    Hochempfindliches光度计zum Messen sehr schwacher Lumineszenz。

    公开(公告)号:EP0580141A2

    公开(公告)日:1994-01-26

    申请号:EP93111671.9

    申请日:1993-07-21

    Inventor: Motolese, Guido

    CPC classification number: G01J1/04 G01J1/0204 G01J1/0223 G01J1/044 G01N21/76

    Abstract: An electronic device for measuring extremely faint light emissions comprises a photomultiplier tube (1) surrounded by a sleeve (3) made of a material which is a good heat conductor, cooled to a low temperature and insulated from the outside, a thermally insulating and optically transparent lightguide body (5) being stably glued to the photocathode of the photomultiplier tube (1) to receive the light radiation emitted by a specimen (6) to be examined, which is inserted in a cavity (8a) of a supporting structure holding a rotary body (11) which can be turned in front of the lightguide body (5), so as to operate as a shutter for the lightguide in a first turned measurement position thereof to allow measurement of the dark signal and then allow, as the rotary body (11) and the specimen (6) held therein are turned to a second measurement position, to measure the light emission from the specimen (6).

    Abstract translation: 用于测量非常微弱的光发射的电子设备包括光电倍增管(1),该光电倍增管由套筒(3)围绕,套管(3)由良好导热体材料制成,被冷却至低温并与外部绝缘,隔热和光学 透明导光体(5)稳定地胶合到光电倍增管(1)的光电阴极上,以接收由待检查样本(6)发射的光辐射,其被插入到支撑结构的空腔(8a)中, 可以在光导体(5)的前方转动的旋转体(11),以便在第一转动测量位置作为光导的快门操作,以允许测量暗信号,然后允许作为旋转体 保持在其中的本体(11)和样品(6)转到第二测量位置,以测量来自样品(6)的光发射。

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