公开(公告)号：KR1020140128962A

公开(公告)日：2014-11-06

申请号：KR1020147020197

申请日：2012-12-21

Applicant: 라디센스 다이어그나스틱스 리미티드

Inventor： 크로닌,도날 ,  오브리엔,제리 ,  바리,리

IPC: G01J1/18 ,  G01J1/42 ,  G01J1/04 ,  G01J3/36 ,  G01N15/14

CPC classification number: G01N21/6486 ,  G01J1/0418 ,  G01J1/0492 ,  G01J1/18 ,  G01J3/36 ,  G01J2003/1213 ,  G01N15/14 ,  G01N15/1484 ,  G01N21/645 ,  G01N21/76 ,  G01N2021/6421 ,  G01N2021/6471 ,  G01N2201/066 ,  G01N2201/12

Abstract: 본 발명은 미세유체 분석기들/기구들 및 방법들을 위한 고해상도의 넓은 동적 범위의 다중 컬러 검출 플랫폼을 제공한다. 검출 플랫폼은 세포 또는 생체 샘플들로부터의 발광의 검출을 위해 다수의 고이득 반도체 광센서를 사용한다. 이러한 센서들로부터의 디지털화된 출력들은 검출 플랫폼의 동적 범위를 확장하면서 이러한 고이득 반도체 광센서들 각각의 해상도를 최적화하는 각각의 컬러에 대한 사전 결정된 알고리즘들을 이용하여 신호 처리 유닛에서 결합되고 가중화된다.

公开(公告)号：US12038389B2

公开(公告)日：2024-07-16

申请号：US17717150

申请日：2022-04-11

Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor： Chung-Pin Chou

IPC: G01N21/95 ,  G01B11/30 ,  H01L21/67

CPC classification number: G01N21/9505 ,  G01B11/303 ,  H01L21/67288 ,  G01N2201/06113 ,  G01N2201/066 ,  G01N2201/10

Abstract: Wafer inspection apparatuses and methods are described. The wafer inspection apparatus includes an optical module, at least one wafer holder for carrying a plurality of wafers, and a plurality of optical sensors. The optical module is configured to emit a plurality of light beams for simultaneously scanning the plurality of wafers carried by the at least one wafer holder. The plurality of optical sensors is configured to receive the light beams reflected by the plurality of wafers.

公开(公告)号：US20240159658A1

公开(公告)日：2024-05-16

申请号：US18451672

申请日：2023-08-17

Applicant: GIST(Gwangju Institute of Science and Technology)

Inventor： Young Dahl JHO ,  Sehyuk LEE ,  Sang-Hyuk PARK

IPC: G01N21/25

CPC classification number: G01N21/255 ,  G01N2201/06113 ,  G01N2201/066 ,  G01N2201/126

Abstract: The present disclosure relates to an apparatus for evaluating thermal conductance of an interface on the basis of how much the phases of acoustic phonons, which are produced in a semiconductor, change on a semiconductor interface. The apparatus for evaluating thermal conductance of a semiconductor interface according to an embodiment of the present disclosure includes: a spectrometer exciting acoustic phonons in a semiconductor by irradiating a laser beam to the semiconductor; and a processor evaluating thermal conductance of an interface of the semiconductor in accordance with a phase difference of a ascending acoustic phonon propagating toward the interface and reflecting from the interface and a descending acoustic phonon propagating in an opposite direction to the interface.

公开(公告)号：US11726036B2

公开(公告)日：2023-08-15

申请号：US17346390

申请日：2021-06-14

Applicant: Apple Inc.

Inventor： Mark Alan Arbore ,  Matthew A. Terrel

IPC: G01N21/59 ,  G01N21/49 ,  G01N21/17 ,  G01N21/47

CPC classification number: G01N21/59 ,  G01N21/49 ,  G01N2021/1782 ,  G01N2021/4709 ,  G01N2021/4711 ,  G01N2201/066 ,  G01N2201/0691 ,  G01N2201/0696 ,  G01N2201/12

Abstract: An illuminator/collector assembly can deliver incident light to a sample and collect return light returning from the sample. A sensor can measure ray intensities as a function of ray position and ray angle for the collected return light. A ray selector can select a first subset of rays from the collected return light at the sensor that meet a first selection criterion. In some examples, the ray selector can aggregate ray intensities into bins, each bin corresponding to rays in the collected return light that traverse within the sample an estimated optical path length within a respective range of optical path lengths. A characterizer can determine a physical property of the sample, such as absorptivity, based on the ray intensities, ray positions, and ray angles for the first subset of rays. Accounting for variations in optical path length traversed within the sample can improve accuracy.

公开(公告)号：US20180106731A1

公开(公告)日：2018-04-19

申请号：US15672696

申请日：2017-08-09

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： MIN HO RIM ,  MYUNG SU OH ,  JUNG SOO KIM ,  YU SIN YANG ,  CHUNG SAM JUN ,  YUN JUNG JEE

IPC: G01N21/95 ,  G01N21/956

CPC classification number: G01N21/9501 ,  G01N21/956 ,  G01N21/95623 ,  G01N2201/066

Abstract: A semiconductor device inspecting apparatus includes a light source for emitting light to a semiconductor pattern. The semiconductor pattern includes a structure that reflects the light from the light source. The semiconductor device inspecting apparatus further includes an objective optical system disposed in a path of the reflected light from the semiconductor pattern, and a first noise filter disposed in a path of the reflected light having passed through the objective optical system, the first noise filter including at least one bar pattern that filters a diffraction noise of the light. The semiconductor device inspecting apparatus additionally includes a second noise filter disposed in a path of the filtered light from the first noise filter, the second noise filter including an outer frame surrounding a central portion. The semiconductor device inspecting apparatus further includes a first photodetector detecting the light having passed through the second noise filter.

公开(公告)号：US20180059003A1

公开(公告)日：2018-03-01

申请号：US15446878

申请日：2017-03-01

Applicant: EcoTec Solutions, Inc.

Inventor： Laurent Jourdainne

IPC: G01N21/01 ,  G01N33/00 ,  G01N21/31 ,  G01K13/00

CPC classification number: G01N21/01 ,  G01J3/427 ,  G01J2003/423 ,  G01J2003/4334 ,  G01K13/00 ,  G01M3/202 ,  G01M3/22 ,  G01N21/031 ,  G01N21/31 ,  G01N21/3504 ,  G01N21/359 ,  G01N21/39 ,  G01N33/0037 ,  G01N33/004 ,  G01N33/0044 ,  G01N33/0054 ,  G01N2021/399 ,  G01N2201/0221 ,  G01N2201/0612 ,  G01N2201/062 ,  G01N2201/066 ,  G01N2201/1241

Abstract: A system and method to discriminate between a first preselected gas and at least one other preselected gas use of an absorption spectroscopy analyzer that includes a Herriott cell and a temperature sensitive light source. The light source operates at a temperature that emits a beam at a wavelength that corresponds to high absorption by a first preselected gas. When a predetermined level of this gas is detected in a gas sample, the analyzer changes the operating temperature of the light source to emit a beam at a wavelength that corresponds to high absorption by a second preselected gas. The second preselected gas can be a different isotope of the first preselected gas.

公开(公告)号：US20180017491A1

公开(公告)日：2018-01-18

申请号：US15717651

申请日：2017-09-27

Applicant: Apple Inc.

Inventor： Mark Alan ARBORE ,  Matthew A. TERREL

IPC: G01N21/59 ,  G01N21/49 ,  G01N21/17 ,  G01N21/47

CPC classification number: G01N21/59 ,  G01N21/49 ,  G01N2021/1782 ,  G01N2021/4709 ,  G01N2021/4711 ,  G01N2201/066 ,  G01N2201/0691 ,  G01N2201/0696 ,  G01N2201/12

Abstract: An illuminator/collector assembly can deliver incident light to a sample and collect return light returning from the sample. A sensor can measure ray intensities as a function of ray position and ray angle for the collected return light. A ray selector can select a first subset of rays from the collected return light at the sensor that meet a first selection criterion. In some examples, the ray selector can aggregate ray intensities into bins, each bin corresponding to rays in the collected return light that traverse within the sample an estimated optical path length within a respective range of optical path lengths. A characterizer can determine a physical property of the sample, such as absorptivity, based on the ray intensities, ray positions, and ray angles for the first subset of rays. Accounting for variations in optical path length traversed within the sample can improve accuracy.

公开(公告)号：US09757027B2

公开(公告)日：2017-09-12

申请号：US15227839

申请日：2016-08-03

Applicant: ADOM, Advanced Optical Technologies Ltd

Inventor： Yoel Arieli ,  Yoel Cohen ,  Shlomi Epstein ,  Dror Arbel ,  Ra'anan Gefen

IPC: A61B3/14 ,  A61B3/10 ,  G01B9/02 ,  G01B11/06 ,  A61B3/00 ,  A61B3/15 ,  G01N21/27 ,  G02B3/08

CPC classification number: A61B3/101 ,  A61B3/0025 ,  A61B3/1005 ,  A61B3/152 ,  G01B9/02021 ,  G01B9/02025 ,  G01B9/02027 ,  G01B9/02044 ,  G01B9/02087 ,  G01B9/0209 ,  G01B11/06 ,  G01B11/0625 ,  G01B11/0675 ,  G01B2290/45 ,  G01N21/274 ,  G01N2201/066 ,  G01N2201/127 ,  G02B3/08

Abstract: A system and method are described for performing tear film structure measurement. A broadband light source illuminates the tear film. A spectrometer measures respective spectra of reflected light from at least one point of the tear film. A color camera performs large field of view imaging of the tear film, so as to obtain color information for all points of the tear film imaged by the color camera. A processing unit calibrates the camera at the point measured by the spectrometer so that the color obtained by the camera at the point matches the color of the spectrometer at the same point. The processing unit determines, from the color of respective points of the calibrated camera, thicknesses of one or more layers of the tear film at the respective points. Other applications are also described.

公开(公告)号：US09739704B2

公开(公告)日：2017-08-22

申请号：US13990692

申请日：2011-11-23

Applicant: Thomas Voit ,  Michael Geissler ,  Harald Quintel ,  Roman Gruler

Inventor： Thomas Voit ,  Michael Geissler ,  Harald Quintel ,  Roman Gruler

IPC: G01N21/03 ,  B01L3/00 ,  G01N21/64

CPC classification number: G01N21/03 ,  B01L3/50825 ,  B01L2300/043 ,  B01L2300/047 ,  B01L2300/0654 ,  G01N21/0303 ,  G01N2021/0378 ,  G01N2021/6482 ,  G01N2201/066

Abstract: Fluid processing tube for use in optical analysis comprising at least one first portion being made from a first material suitable for optical analysis and being configured to include two optical paths of different lengths, and at least one second portion connected to said first portion and being made from a second material different from said first material.

公开(公告)号：US20160338585A1

公开(公告)日：2016-11-24

申请号：US15227839

申请日：2016-08-03

Applicant: ADOM, Advanced Optical Technologies Ltd

Inventor： Yoel Arieli ,  Yoel Cohen ,  Shlomi Epstein ,  Dror Arbel ,  Ra'anan Gefen

IPC: A61B3/10 ,  G01N21/27 ,  A61B3/00 ,  A61B3/15 ,  G02B3/08 ,  G01B11/06 ,  G01B9/02

CPC classification number: A61B3/101 ,  A61B3/0025 ,  A61B3/1005 ,  A61B3/152 ,  G01B9/02021 ,  G01B9/02025 ,  G01B9/02027 ,  G01B9/02044 ,  G01B9/02087 ,  G01B9/0209 ,  G01B11/06 ,  G01B11/0625 ,  G01B11/0675 ,  G01B2290/45 ,  G01N21/274 ,  G01N2201/066 ,  G01N2201/127 ,  G02B3/08

Abstract: A system and method are described for performing tear film structure measurement. A broadband light source illuminates the tear film. A spectrometer measures respective spectra of reflected light from at least one point of the tear film. A color camera performs large field of view imaging of the tear film, so as to obtain color information for all points of the tear film imaged by the color camera. A processing unit calibrates the camera at the point measured by the spectrometer so that the color obtained by the camera at the point matches the color of the spectrometer at the same point. The processing unit determines, from the color of respective points of the calibrated camera, thicknesses of one or more layers of the tear film at the respective points. Other applications are also described.

Abstract translation: 描述了进行泪膜结构测量的系统和方法。 宽带光源照亮泪膜。 光谱仪测量来自泪膜的至少一个点的反射光的各个光谱。 彩色照相机对泪膜进行大视野成像，以获得由彩色照相机成像的泪膜的所有点的颜色信息。 处理单元在由光谱仪测量的点处校准相机，使得在该点处由相机获得的颜色与同一点处的光谱仪的颜色匹配。 处理单元根据校准的相机的各个点的颜色确定各个点处的泪膜的一层或多层的厚度。 还描述了其它应用。