Abstract:
Discharge tube apparatus includes an outer containing vessel 8 and a structure comprising five metal cylinders 10, 11, 12, 13 and 14 located coaxially within it. Each of the metal cylinders includes projecting spacers 15 on its outer surface which serve to space it from adjacent ones. Such a structure is thermally insulating and enables a large temperature difference to be maintained between the interior of the discharge tube and the outer containing vessel 8. In other embodiments (not shown), a plurality of structures are included disposed along the axis of the tube. Also dispenser segments for dispensing part of the amplifying medium of a metal vapour laser may be included and arranged to shield vulnerable surfaces in the tube from direct exposure to the discharge.
Abstract:
L'invention concerne un canon à électrons pour accélérateur linéaire, capable de fournir un courant électronique modulé destiné à être injecté dans une structure accélératrice (3). Un tel canon (1) à électrons comporte une cavité résonnante (13-18) dans laquelle, une cathode (8) et une grille (10) délimitent un espace grille-cathode (10-8) sur lequel est fermée cette cavité résonnante (13-18); une onde eléctromagne- tique injectée dans cette cavité résonnante (13-18), détermine entre la grille (10) et la cathode (8) une différence de potentiel alternative par laquelle est modulé le courant électronique. L'invention s'applique notamment à des machines d'irradiation industrielles.
Abstract:
Embodiments of systems, devices, and methods relate to fast beam position monitoring for detecting beam misalignment in a beam line. In an example, a fast beam position monitor includes a plurality of electrodes extending into an interior of a component of a beam line. The fast beam position monitor is configured to detect a position of a beam passing through the component of the beam line based on beam halo current. Embodiments of systems, devices, and methods further relate to noninvasively monitoring parameters of beams advancing along a beam line. In examples, gas is puffed into a pumping chamber along a beam line. One or more beam parameters are measured from fluorescence resulting from collisions of energetic beam particulates of a beam advancing through the beam line.
Abstract:
An ion reaction device is provided having an ion injection inlet for receiving a plurality of ions and an ion ejection outlet through which ions can exit the device. The reaction device includes a plurality of non-linear rods disposed relative to one another so as to provide an axial region configured to receive a plurality of anions and cations via said ion injection inlet, and a plurality of trapping regions in communication with the axial region in which said anions and cations can be confined. A DC voltage source is adapted to apply a DC voltage across at least two of said rods so as to generate an electric field within at least a portion of said axial region for spatially separating the received anions and cations and guiding the anions into one of said trapping regions and the cations into another one of said trapping regions.
Abstract:
The invention relates to an electron gun 100 for use in a cathode ray tube. The electron gun 100 has an electron source 10, a body 20 with a transmission cavity 25 of which the wall 28 is at least partly coated with an electrical insulator for the emission of secondary electrons, and an electrode 30 for applying a first electric field between the entrance 26 and the exit 27 of the cavity. The electron gun is characterized in that it comprises means for preventing the travelling of positive ions, which are formed by collisions of electrons that have exited from the cavity 25, in reverse direction along the same path as the electrons and colliding with the module 20. Such collisions can damage the cavity exit 27 or the electrical insulator on the wall 28. This is undesirable because the current density of the electron beam 101 exiting from the cavity 25 will deteriorate.
Abstract:
A display tube comprises an electron source (10), a module (20) provided with a guidance cavity (25R, 25G, 25B) for guiding electrons emitted by the electron source (10) to an exit aperture (27R, 27G, 27B) of the guidance cavity (25R, 25G, 25B) and beam-shaping means (30) for forming an electron beam (EBR, EBG, EBB) from guided electrons leaving the exit aperture (27R, 27G, 27B). The electron beam (EBR, EBG, EBB) travels towards a display screen (3). The beam-shaping means (30) are arranged to change a direction in which the electron beam (EBR, EBG, EBB) leaves the guidance cavity (25R, 25G, 25B) in accordance with a predetermined application. For example, the electron beam (EBR, EBG, EBB) is deflected to realize gun pitch modulation in the electron gun of a cathode ray tube. As the electron beam is deflected near the exit aperture (27R, 27G, 27B), spot errors are reduced and the display tube has a relatively high image quality.
Abstract:
Ion source filaments, as well as methods and apparatus associated with the same are provided. The source filaments have a design that includes a relatively small surface area from which electrons are emitted (i.e., active portion) as compared to certain conventional source filaments. Suitable designs include filaments that have a V-shape or U-shape active portion, rather than a coiled active portion as in certain conventional source filaments. The source filaments of the present invention can increase the efficiency of ion generation and, in particular, the generation of multiply charged ionic species. The increased ion generation efficiency may enable formation of ion beams having relatively high beam currents suitable for implantation.
Abstract:
An immersion lens for a charged particle beam lithography system includes a magnetically floating shield that limits a deflection magnetic field from creating eddy currents in electrically conductive components of the system downstream from the shield. The surface of the shield lies parallel or approximately parallel to a magnetic equipotential surface of the focusing magnetic field so that the shield does not affect the focusing magnetic field. The shield is, e.g., a ferrite disk or a hollow ferrite cone defining a central bore for passage of the charged particle beam.