公开(公告)号：WO2013009689A8

公开(公告)日：2013-09-06

申请号：PCT/US2012045932

申请日：2012-07-09

Applicant: MICROCHIP TECH INC ,  FRANCISCO RONALDO ,  WONG CHI LUNG ,  MESSANG TIM ,  ABERRA EZANA HAILE

Inventor： FRANCISCO RONALDO ,  WONG CHI LUNG ,  MESSANG TIM ,  ABERRA EZANA HAILE

IPC: G01R31/28

CPC classification number: G01R31/2875 ,  G01R31/2891

Abstract: A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally conductive test probe for electrically and thermally coupling, respectively, of the strip tester to the DUTs. Temperature measurement of each of the plurality of DUTs is performed by a temperature measuring device. The temperature measuring device can be part of the test board of the strip tester and will be in thermal communications with the DUT through the thermally conductive test probe, or temperature of die DUT can be measurement with an RTD embedded in the thermally conductive test probe, thereby providing faster thermal response time.

Abstract translation: 将多个待测设备（DUT）布置在具有温控加热器块的条测试器中。 每个DUT分别具有一组电气测试探针和一个导热测试探针，用于分别将测试条电气和热耦合到DUT。 多个DUT中的每一个的温度测量由温度测量装置执行。 温度测量装置可以是条测试器的测试板的一部分，并且将通过导热测试探针与DUT热连通，或者DUT的温度可以使用嵌入在导热测试探针中的RTD进行测量， 从而提供更快的热响应时间。

公开(公告)号：WO2013009689A1

公开(公告)日：2013-01-17

申请号：PCT/US2012/045932

申请日：2012-07-09

Applicant: MICROCHIP TECHNOLOGY INCORPORATED ,  FRANCISCO, Ronaldo ,  WONG, Chi, Lung ,  MESSANG, Tim ,  ABERRA, Ezana, Haile

Inventor： FRANCISCO, Ronaldo ,  WONG, Chi, Lung ,  MESSANG, Tim ,  ABERRA, Ezana, Haile

IPC: G01R31/28

CPC classification number: G01R31/2875 ,  G01R31/2891

Abstract: A plurality of devices under test (DUT) are arranged in a strip tester having a temperature controlled heater block. Each DUT has a respective set of electrical test probes and a thermally conductive test probe for electrically and thermally coupling, respectively, of the strip tester to the DUTs. Temperature measurement of each of the plurality of DUTs is performed by a temperature measuring device. The temperature measuring device can be part of the test board of the strip tester and will be in thermal communications with the DUT through the thermally conductive test probe, or temperature of die DUT can be measurement with an RTD embedded in the thermally conductive test probe, thereby providing faster thermal response time.

Abstract translation: 被测试的多个器件（DUT）布置在具有温度控制的加热器块的条带测试器中。 每个DUT具有各自的电测试探针和导热测试探针，用于将带状测试仪分别电耦合到DUT。 多个DUT中的每一个的温度测量由温度测量装置执行。 温度测量装置可以是条形测试仪的测试板的一部分，并且将通过导热测试探头与DUT进行热通信，或者DUT的温度可以通过嵌入在导热测试探头中的RTD进行测量， 从而提供更快的热响应时间。