DEFECT-FREE GROUP III - NITRIDE NANOSTRUCTURES AND DEVICES USING PULSED AND NON-PULSED GROWTH TECHNIQUES
    1.
    发明申请
    DEFECT-FREE GROUP III - NITRIDE NANOSTRUCTURES AND DEVICES USING PULSED AND NON-PULSED GROWTH TECHNIQUES 审中-公开
    无缺陷III组 - 使用脉冲和非脉冲生长技术的氮化物纳米结构和器件

    公开(公告)号:WO2010022064A1

    公开(公告)日:2010-02-25

    申请号:PCT/US2009/054181

    申请日:2009-08-18

    Abstract: Exemplary embodiments provide semiconductor devices including high-quality (i e, defect free) Group III - Nitride nanostructures and uniform Group III - Nitride nanostructure arrays as well as their scalable processes for manufacturing, where the position, orientation, cross-sectional features, length and the crystallinity of each nanostructure can be precisely controlled A pulsed growth mode can be used to fabricate the disclosed Group III - Nitride nanostructures and/or nanostructure arrays providing a uniform length of about 0.01 - 20 micrometers (11 m) with constant cross-sectional features including an exemplary diameter of about 10 nanometers (nm) - 500 micrometers (11 m) Furthermore, core-shell nanostructure/MQW active structures can be formed by a core-shell growth on the non-polar sidewalls of each nanostructure and can be configured in nanoscale photoelectronic devices such as nanostructure LEDs and/or nanostructure lasers to provide tremendously-high efficiencies

    Abstract translation: 示例性实施例提供了包括高质量(即,无缺陷)III族氮化物纳米结构和均匀的III族氮化物纳米结构阵列的半导体器件及其可制造的可扩展工艺,其中位置,取向,横截面特征,长度和 可以精确地控制每个纳米结构的结晶度。脉冲生长模式可用于制造所公开的III-氮化物纳米结构和/或纳米结构阵列,其提供具有恒定横截面特征的约0.01-20微米(11m)的均匀长度 包括约10纳米(nm) - 500微米(11μm)的示例性直径。此外,核 - 壳纳米结构/ MQW活性结构可以通过在每个纳米结构的非极性侧壁上的核 - 壳生长形成,并且可以被配置 在纳米尺度的光电子器件如纳米结构的LED和/或纳米结构的激光器中,以提供极高的效率

    DEFECT-FREE GROUP III - NITRIDE NANOSTRUCTURES AND DEVICES BASED ON REPETITIVE MULTIPLE STEP GROWTH-ETCH SEQUENCE
    7.
    发明申请
    DEFECT-FREE GROUP III - NITRIDE NANOSTRUCTURES AND DEVICES BASED ON REPETITIVE MULTIPLE STEP GROWTH-ETCH SEQUENCE 审中-公开
    无缺陷III组 - 基于重复多步增长序列的硝酸纳结构和器件

    公开(公告)号:WO2012075461A1

    公开(公告)日:2012-06-07

    申请号:PCT/US2011/063179

    申请日:2011-12-02

    Abstract: Embodiments provide semiconductors including defect free Group III - Nitride nanostructures and uniform nanostructure arrays as well as processes for manufacturing, where features can be precisely controlled. A Repetitive Multiple Step Growth-Etch Sequence can be used to fabricate uniform Group III - Nitride semiconductor nanostructures and/or nanostructure arrays. Furthermore, core-shell nanostructure/MQW active structures can be formed by a core-shell growth on the non-polar sidewalls of each nanostructure and can be configured in nanoscale optoelectronic devices to provide very high efficiencies. Additional growth mode transitions between different Repetitive Multiple Step Growth-Etch Sequences or between a Repetitive Multiple Step Growth-Etch Sequence and conventional growth mode are employed in order to incorporate certain Group III - Nitride compounds into the nanostructures and form devices. In addition. Group III - Nitride substrate structures can be formed by coalescing Group III - Nitride nanostructures and/or nanostructure arrays to fabricate visible LEDs and lasers.

    Abstract translation: 实施例提供了半导体,包括无缺陷的III族氮化物纳米结构和均匀的纳米结构阵列,以及可精确控制特征的制造工艺。 重复的多步生长蚀刻序列可用于制造均匀的III族 - 氮化物半导体纳米结构和/或纳米结构阵列。 此外,核 - 壳纳米结构/ MQW活性结构可以通过在每个纳米结构的非极性侧壁上的核 - 壳生长形成,并且可以配置在纳米尺度的光电子器件中以提供非常高的效率。 使用不同重复多步生长蚀刻序列之间或重复多步生长蚀刻序列和常规生长模式之间的附加生长模式转变,以便将某些III族 - 氮化物化合物掺入纳米结构并形成器件。 此外。 III族 - 氮化物衬底结构可以通过聚集III-氮化物纳米结构和/或纳米结构阵列来制造可见的LED和激光器来形成。

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