기판 처리 방법 및 장치, 및 반도체 장치의 제조방법
    4.
    发明公开
    기판 처리 방법 및 장치, 및 반도체 장치의 제조방법 有权
    基板处理方法和装置以及半导体器件的制造工艺

    公开(公告)号:KR1020070096973A

    公开(公告)日:2007-10-02

    申请号:KR1020070029914

    申请日:2007-03-27

    Abstract: A substrate processing method, a substrate processing apparatus, and a fabrication process of a semiconductor device are provided to remove stably an oxide layer from a metal layer formed on a substrate as a processing target. A method for processing a substrate having an insulating layer and a metal layer includes a process for supplying a carboxylic acid anhydride on the substrate. The process for supplying the carboxylic acid anhydride on the substrate includes a process for heating the substrate. The metal layer includes a Cu layer. The method for processing the substrate further includes a process for removing an oxide layer from the metal layer. The method for processing the substrate further includes a dehydration process for the insulating layer. The insulating layer includes at least one of a porous layer and a layer having fluorine.

    Abstract translation: 提供基板处理方法,基板处理装置以及半导体装置的制造工艺,以便从作为处理对象的基板上形成的金属层稳定地去除氧化物层。 用于处理具有绝缘层和金属层的基板的方法包括在基板上供给羧酸酐的方法。 在基材上供给羧酸酐的方法包括加热基材的方法。 金属层包括Cu层。 用于处理衬底的方法还包括从金属层去除氧化物层的工艺。 用于处理衬底的方法还包括用于绝缘层的脱水工艺。 绝缘层包括多孔层和具有氟的层中的至少一种。

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