Abstract:
A tire location determination device according to the present invention comprises a plurality of pressure measurers for individually measuring the internal pressure of a plurality of tires; and a processing part for receiving pressure signals which vary with the curvature of roads from each pressure measurer and processing them. By this, the present invention determines the location of a tire by comparing the signal values and phase differences between the pressure signals. [Reference numerals] (160) Processing part
Abstract:
PURPOSE: A tire monitoring device is provided to reduce the number of processes, to simplify a configuration by a rivet type joining device using a leaf spring, and to facilitate separation and joining of an antenna valve and a tire condition measurement module. CONSTITUTION: A tire monitoring device comprises a tire condition measurement module(10), an antenna valve(20), and a leaf spring(30). The tire condition measurement module is attached inside a vehicle tire, thereby generating tire condition information by measuring the condition of the tire. The antenna valve transmits tire condition information and makes air flow according to the tire pneumatic information of the transmitted tire condition information. The leaf spring electrically and elastically connects the tire condition measuring module and the antenna valve.
Abstract:
본 발명의 일 실시예에 따른 햅틱 피드백 디바이스는 진동이 요구되는 햅틱 디바이스로 제공되는 터치 패널; 및 상기 터치 패널의 터치면에 제공되는 터치압이 최대 임계 터치압 미만인 경우 상기 터치압에 대향하는 구동력을 상기 터치면 방향으로 제공하여 상기 터치 패널의 위치변화가 없도록 하며, 상기 터치압이 상기 최대 임계 터치압 이상으로 가압되면 상기 구동력이 정지되어 상기 터치 패널이 상기 터치압에 대응하여 위치변화를 일으키도록 상기 터치 패널의 터치면의 반대의 면에 구비되는 액츄에이터;를 포함할 수 있다.
Abstract:
PURPOSE: A piezoelectric body and a manufacturing method thereof, a cantilever using the same and a manufacturing method thereof are provided to improve hysteresis property and creep property by doping lanthanum and niobium. CONSTITUTION: A piezoelectric driving body is formed into a flat plate shape(S100). The piezoelectric driving body fixes one-side end on a substrate(S200). The piezoelectric driving body separates other side of an end part on the substrate. The voltage is sanctioned in both sides of a piezoelectric layer. The piezoelectric layer drives the end part separated in substrate to up and down. A sacrifice layer locates between the one-side end of the piezoelectric driving body and the substrate. The sacrifice layer provides separated space to the piezoelectric driving body.
Abstract:
A light modulator apparatus for calibration is provided to increase the accuracy and the reliability of the optical modulation by compensating for the displacement error. A photo detector(310) measures the light emission amount of the whole diffracted light outputted from a light modulator by receiving the part of the diffracted light outputted from the light modulator(230). The information about the light emission amount of the diffracted light measured by the photo detector is transferred to a conversion unit(320). The conversion unit reversely changes the displacement induced from the light modulator to the displacement object by using the light amount information. The second storage(325) stores the displacement-quantity of light table. A voltage compensation part(330) receives the information about the displacement error calculated from the conversion unit. The voltage compensation part calculates the compensation voltage value to correspond to the delivered information.
Abstract:
A light modulator for reducing a laser speckle is provided to prevent an increase of volume by integrating a phase control pattern for reducing a laser speckle therewith without using an additional device. A light modulator(405) is formed to reduce the laser speckle. A structure layer includes an insulating layer(610), a center part(630), and a top mirror(650). The insulating layer is located on a surface of a substrate. The center part is formed at a position separated from the insulating layer. The top mirror is formed on a surface of the structure layer. A first phase control pattern is formed at the center part. A piezoelectric driving body is formed at both ends of the structure layer in order to move upwardly and downwardly the center part of the structure layer.
Abstract:
An apparatus and a method for inspecting an optical modulator are provided to inspect functions and performance of the optical modulator in a chip level. A probe card(410) is formed to convert an inputted control signal to a driving signal. The probe card comes in contact with each of driving signal input pads of an optical modulator. The optical modulator includes one or more micro-mirrors and one or more driving signal input pads connected to the micro-mirrors. The micro-mirrors are moved upwardly and downwardly by using driving signals received through the driving signal input pads. An image control circuit(420) generates the control signal for identifying an erroneous operation of the optical modulator. The image control circuit is electrically connected to the probe card in order to transmit the control signal.
Abstract:
A temperature adaptive optical modulator is provided to improve adaptability to peripheral temperature by using a heater. A center part of a structure layer is separated in a predetermined interval apart from a substrate(295). A driving unit is positioned on the structure layer in order to move the center part of the structure layer in a vertical direction. An upper reflection layer(270) is positioned on an upper portion of the center part of the structure layer in order to reflect and diffract incident light. A lower reflection layer is positioned on the substrate in order to reflect and diffract the incident light by using a stepped part and the upper reflection layer. A heater(205) is positioned at an upper part of the structure layer and a lateral surface of the driving unit in order to generate heat by using a voltage.