Abstract:
SWP 통신 시에 소모되는 전력을 최소화 또는 줄일 수 있는 단일 와이어 프로토콜 통신에서의 데이터 통신 방법이 개시된다. SWP 통신의 경우에 양방향 통신이 단일 와이어 입출력(I/O)을 통해 서로 다른 데이터 전송 방식으로 수행된다. 먼저, 통신 패킷의 데이터 비트들 중에서 제1 로직상태를 갖는 비트들의 개수가 설정된 개수를 초과하는 지가 송신 시에 체크된다. 제1 로직상태를 갖는 비트들의 개수가 설정된 개수를 초과하면, 상기 통신 패킷의 데이터 비트들의 로직상태는 반전된다. 상기 로직상태의 반전 시에 통신 패킷의 극성 비트가 세팅될 수 있다. 상기 반전된 데이터 비트들이 상기 단일 와이어 입출력을 통해 전송될 때 전력 소모가 줄어든다. 본 발명의 개념에 따르면, 하드웨어의 추가적 부담없이 SWP 통신 시의 전력소모 이슈가 개선된다.
Abstract:
An image sensor and a driving method thereof for appropriately controlling the potential level of a reset device are provided not to be limited within subjects mentioned and to make the other subjects, which are not mentioned, specifically understood as the person skilled in the art from the following material. An image sensor comprises a photoelectric conversion device, a charge coupled device, a charge transfer device, a pixel array(10), and a matrix driving unit(20). The charge transfer device transmits an electric charge accumulated in the photoelectric conversion device to the charge coupled device. In the pixel array, a unit pixel including a reset device for resetting the charge coupled device is arranged in a matrix type. The matrix driving unit provides a boosting reset signal to the reset device which is boosted in order to have a level higher than a power supply voltage.
Abstract:
A method of correcting fault data caused by charge loss in a non-volatile memory device is provided to maintain the reliability of data of a memory cell included in the non-volatile memory device even in case of charge loss. According to a method of correcting fault data of a non-volatile memory device including a plurality of memory cells, fault data is detected from a second data group, by comparing a first data group read from the memory cells by referring to a first voltage(S410) with the second data group read from the memory cells(S430) by referring to a second voltage higher than the first voltage(S440). Fault data is detected from the first data group, through ECC(Error Correction Coding)(S450). The data of the memory cells are rewritten, by correcting fault data of the first data group and fault data of the second data group(S470).
Abstract:
A memory system and a data reading method thereof are provided to perform random access, by comprising a memory array capable of performing random access. A memory system includes a memory(200) and a memory controller(100) controlling the memory. The memory includes a random access capable memory(220) having a memory array capable of performing random access, a NAND flash memory(240) and a selection circuit(260). The selection circuit selects whether the memory controller controls the random access capable memory or the NAND flash memory.