Abstract:
PURPOSE: A fuse structure and an electrical fuse including the fuse structure and a semiconductor device including the electrical fuse are provided to prevent a re-growth phenomenon by forming a moisture absorption prevention film which surrounds a fuse conductive layer pattern. CONSTITUTION: First and second electrodes(120,130) are extended to a first direction. One end of the first electrode and one end of the second electrode are separated and are faced each other. An insulating layer(200) is formed between the one end of the first electrode and the one end of the second electrode which are faced each other. A conductive film(162) is touched with the first and second electrodes. The conductive film is formed in the top of the insulating layer by overlapping with a part of the first and second electrodes. A third electrode which is extended to a second direction which is vertical with the first direction is formed in the inner side of the insulating layer.
Abstract:
PURPOSE: A method for fabricating a semiconductor device including a capacitor-less one-transistor memory cell is provided to increase a volume to store electric charges by forming the protruded part of a cell floating body pattern to be wider that a cell gate pattern. CONSTITUTION: A first floating body pattern(6a) is formed on the lower insulating film(3) of a substrate(1). A first gate pattern(33a) is formed to cover the sidewall of the first floating body pattern. A part of the first floating body pattern which is adjacent to the first gate pattern is etched. The first floating body pattern has a protruded part(7). A first dopant region is formed in the etched region of the first floating body pattern.
Abstract:
PURPOSE: A semiconductor device including a fuse of a capacitor structure is provided to simplify a manufacturing process by using a bottom electrode of a capacitor structure as a filament of a fuse. CONSTITUTION: A cathode electrode is formed on a semiconductor substrate. An anode electrode is formed on the cathode electrode. A cylinder type first filament(41) is formed between the cathode electrode and the anode electrode. The first filament electrically connects the cathode electrode to the anode electrode. A molding unit surrounds the side of the first filament. A dielectric layer(40a,40b) is formed in the first filament.
Abstract:
커패시터 없는 1-트랜지스터 메모리 셀을 갖는 반도체소자의 제조방법을 제공한다. 이 방법은 기판의 저면 절연막 상에 제1 플로팅 바디 패턴을 형성하는 것을 포함한다. 상기 제1 플로팅 바디 패턴의 상부를 가로지르며 상기 제1 플로팅 바디 패턴의 측벽들을 덮는 제1 게이트 패턴을 형성한다. 상기 제1 게이트 패턴 양 옆의 상기 제1 플로팅 바디 패턴을 부분 식각하되, 상기 제1 플로팅 바디 패턴은 상기 부분 식각된 영역들 사이에서 상기 부분 식각된 영역들 보다 상대적으로 돌출된 부분을 갖는다. 상기 제1 플로팅 바디 패턴의 상기 부분 식각된 영역들 내에 제1 불순물 영역들을 형성한다.
Abstract:
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent a short with an adjacent bottom electrode by supporting the bottom electrode with a support structure. CONSTITUTION: Bottom electrodes(110a) of a cylindrical shape comprises a constant height and a flat upper side. The bottom electrodes are repeatedly arranged on the substrate. Support structures(120) are comprised between the bottom electrodes, are contacted with the part of an outer wall of the bottom electrodes, and supports the contacted bottom electrodes. A dielectric layer(122) is formed along the surface of the support structures and the bottom electrodes. A top electrode is formed on the dielectric layer.