전자기파의 전기장 집속을 위한 나노갭 디바이스 및 이를 이용하여 나노입자를 검출하기 위한 시스템
    3.
    发明公开
    전자기파의 전기장 집속을 위한 나노갭 디바이스 및 이를 이용하여 나노입자를 검출하기 위한 시스템 有权
    用于现场增强的纳米装置和使用其的纳米颗粒检测系统

    公开(公告)号:KR1020100048677A

    公开(公告)日:2010-05-11

    申请号:KR1020080107948

    申请日:2008-10-31

    CPC classification number: H01Q15/0086

    Abstract: PURPOSE: A nanogap device for focusing electric field of electromagnetic wave and a system for detecting nanoparticles are provided to focus electric field from teraherz to far infrared ray area and to detect nanoparticle having a particle size of 10nm or less. CONSTITUTION: A nanogap device(100) for focusing electric field g of an electromagnetic wave comprises: a film(110) consisting of an electrically conductive material; and a nanogap(120) having a width (a) between a skin depth and a Thomas fermi occlusion length which is decided according to an electromagnetic wave(10) and conductive material. The electromagnetic wave has a wavelength of teraherz to far infrared ray range. The conductive is a material metal or carbon nanotube. The metal is a gold. The shape of nanogap is rectangular or slip-shape.

    Abstract translation: 目的:提供用于聚焦电磁波电场的纳米胶片装置和用于检测纳米颗粒的系统,以将电场从太赫兹聚焦到远红外线区域,并检测粒径为10nm以下的纳米粒子。 构成:用于聚焦电磁波的电场g的纳米隙装置(100)包括:由导电材料构成的膜(110); 和具有根据电磁波(10)和导电材料决定的皮肤深度和托马斯费米遮挡长度之间的宽度(a)的纳米凹口(120)。 电磁波的波长为太赫兹至远红外线范围。 导电是材料金属或碳纳米管。 金属是金子。 纳米胶的形状为矩形或滑状。

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