Abstract:
The present invention relates to a carrier substrate including regions having different wettabilities and a method for processing a device substrate using the same. In the method for processing the device substrate, the carrier substrate, which is having a low wettability region in a front surface and a high wettability region having wettability relatively higher than that of the lower wettability region, is provided. The device substrate is provided. An adhesive layer is provided at the front surface of the carrier substrate or at the front surface of the device substrate. The front surface of the carrier substrate and the front surface of the device substrate are attached by using the adhesive layer. The rear surface of the device substrate is processed. At least a part of the adhesive layer on the high wettability region is removed. The carrier substrate is attached and detached from the processed device substrate.
Abstract:
실리콘 웨이퍼 내에 수직 방향으로 형성된 비아 홀(via hole); 상기 비아 홀의 내부에 순차적으로 배치된 도전체, 확산 방지막 및 절연막; 상기 비아 홀 상부에 배치된 Ta/Al/TiN 를 포함하는 상부 전극; 및, 상기 실리콘 웨이퍼 후면에 배치된 접지용 전극: 을 포함하는, 구리 이온 드리프트 측정용 관통전극(Through Silicon Via, TSV) 구조체를 제공한다.
Abstract:
PURPOSE: A structure and method for measuring copper ion drift are provided to predict the lifetime of an element in a short time by changing acceleration conditions of electric field and heat for reliability test. CONSTITUTION: A via hole is formed in a silicon wafer in the vertical direction. A conductor(5), a diffusion barrier(4) and an insulating film(3) are successively arranged in the via hole. An upper electrode includes a diffusion barrier(6), Al(7) and TiN(8). The diffusion barrier, Al and TiN are arranged on the upper side of the via hole. A ground electrode(9) is arranged on the back side of the silicon wafer.