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公开(公告)号：KR1020050030035A
公开(公告)日：2005-03-29
申请号：KR1020030066349
申请日：2003-09-24
Applicant: 학교법인연세대학교
IPC: G01M11/02
Abstract: An apparatus and a method for measuring distribution of a refractive index are provided to precisely and stably measure the refractive index of a workpiece regardless of the kind or size of workpieces. An apparatus for measuring distribution of a refractive index includes a light source(30) and at least one lattice. The lattice includes first and second lattices(32,34). A workpiece is aligned between the first and second lattices(32,34). The workpiece includes optical fiber, such as plastic optical fiber or a GRIN lens. The workpiece is aligned lengthwise in such a manner that beam radiated from the light source(30) is incident into a lateral portion of the workpiece. Refractive index adjustment oil(33) is inserted between the first and second lattices(32,34).
Abstract translation: 提供了用于测量折射率分布的装置和方法，以精确且稳定地测量工件的折射率，而不管工件的种类或尺寸如何。 用于测量折射率分布的装置包括光源（30）和至少一个晶格。 格子包括第一和第二晶格（32,34）。 工件在第一和第二晶格（32,34）之间对准。 工件包括光纤，如塑料光纤或GRIN透镜。 工件沿长度方向对齐，使得从光源（30）辐射的光束入射到工件的侧面部分。 折射率调节油（33）插入在第一和第二格子（32,34）之间。
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公开(公告)号：KR1020040001590A
公开(公告)日：2004-01-07
申请号：KR1020020036848
申请日：2002-06-28
Applicant: 학교법인연세대학교
IPC: G01N21/45
Abstract: PURPOSE: A scan-type phase transition three-dimensional shape measuring device and a measuring method thereof are provided to measure a shape of a moving object while improving spatial resolution. CONSTITUTION: A scan-type phase transition three-dimensional shape measuring device measures a three-dimensional shape of a moving object by using an interference pattern. The scan-type phase transition three-dimensional shape measuring device includes a light source(1) and a grating(3) inclined with respect to an object to be measured. Light radiated from the light source passes through the grating. The interference pattern is formed by an image formed on the object to be measured and an image of the grating(3). The interference pattern is detected by means of an image detecting device(6). The object is moved with respect to the scan-type phase transition three-dimensional shape measuring device or the scan-type phase transition three-dimensional shape measuring device is moved with respect to the object so as to scan the object.
Abstract translation: 目的：提供扫描型相变三维形状测量装置及其测量方法，以在提高空间分辨率的同时测量移动物体的形状。 构成：扫描型相变三维形状测量装置通过使用干涉图案来测量移动物体的三维形状。 扫描型相变三维形状测量装置包括相对于被测量物体倾斜的光源（1）和光栅（3）。 从光源照射的光穿过光栅。 干涉图案由形成在待测物体上的图像和光栅（3）的图像形成。 通过图像检测装置（6）检测干涉图案。 相对于扫描型相变三维形状测量装置移动物体，或者扫描型相变三维形状测量装置相对于物体移动以扫描物体。
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公开(公告)号：KR100489431B1
公开(公告)日：2005-05-12
申请号：KR1020020036848
申请日：2002-06-28
Applicant: 학교법인연세대학교
IPC: G01N21/45
Abstract: 스캔식 위상천이 3차원 형상측정 장치 및 측정 방법이 개시되어 있다.
이 개시된 3차원 형상 측정장치는, 위상천이된 간섭 무늬를 이용하여 피검체의 3차원 형상을 측정하는 장치에 있어서, 광원; 피검체에 대해 소정 각도로 기울어지게 배치되고, 상기 광원에서 조사된 광이 통과되는 격자; 광이 격자를 통과하여 피검체에 형성된 이미지와 격자의 이미지가 합성되어 형성된 간섭무늬를 측정하는 영상감지소자;를 포함하고, 상기 피검체를 3차원 형상측정 장치에 대해 이동시키거나 3차원 형상측정 장치 전체를 피검체에 대해 이동시켜 스캐닝함으로써 위상천이된 간섭 무늬를 얻을 수 있도록 된 것을 특징으로 한다.
본 발명은 기존의 모아레 형상측정 방법과는 다르게 스캔 방식을 이용하므로 높은 공간적 분해능을 가질 수 있을 뿐만 아니라 피검체의 크기에 무관하게 3차원 형상을 측정할 수 있는 이점이 있다.
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