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公开(公告)号:WO2010088194A3
公开(公告)日:2010-11-25
申请号:PCT/US2010022050
申请日:2010-01-26
Applicant: ADVANCED TECH MATERIALS , CHEN TIANNIU , BILODEAU STEVEN , BOGGS KARL E , JIANG PING , KORZENSKI MICHAEL B , MIRTH GEORGE , VAN BERKEL KIM
Inventor: CHEN TIANNIU , BILODEAU STEVEN , BOGGS KARL E , JIANG PING , KORZENSKI MICHAEL B , MIRTH GEORGE , VAN BERKEL KIM
CPC classification number: C11D11/0041 , C11D1/66 , C11D1/667 , C11D1/825 , C11D3/2072 , C11D3/2093 , C11D3/43 , C11D11/0047 , G03F7/70341 , G03F7/70925
Abstract: Compositions and methods of using the said composition for removing polymeric materials from surfaces, preferably cleaning contaminant buildup from a lithography apparatus without total disassembly of the said apparatus. The said compositions comprise at least one organic solvent and one non-ionic surfactant. Moreover, the pH of the said composition is about 5 to 9.
Abstract translation: 使用所述组合物从表面除去聚合物材料的组合物和方法,优选地从光刻设备清洗污染物积聚物,而无需完全拆卸所述设备。 所述组合物包含至少一种有机溶剂和一种非离子表面活性剂。 此外,所述组合物的pH为约5至9。
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公开(公告)号:WO2010088194A2
公开(公告)日:2010-08-05
申请号:PCT/US2010022050
申请日:2010-01-26
Applicant: ADVANCED TECH MATERIALS , CHEN TIANNIU , BILODEAU STEVEN , BOGGS KARL E , JIANG PING , KORZENSKI MICHAEL B , MIRTH GEORGE , VAN BERKEL KIM
Inventor: CHEN TIANNIU , BILODEAU STEVEN , BOGGS KARL E , JIANG PING , KORZENSKI MICHAEL B , MIRTH GEORGE , VAN BERKEL KIM
CPC classification number: C11D11/0041 , C11D1/66 , C11D1/667 , C11D1/825 , C11D3/2072 , C11D3/2093 , C11D3/43 , C11D11/0047 , G03F7/70341 , G03F7/70925
Abstract: Compositions and methods of using said composition for removing polymeric materials from surfaces, preferably cleaning contaminant buildup from a lithography apparatus without total disassembly of said apparatus.
Abstract translation: 使用所述组合物从表面除去聚合材料的组合物和方法,优选地从光刻设备清洗污染物积聚物,而无需完全拆卸所述设备。
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公开(公告)号:SG2014005136A
公开(公告)日:2014-03-28
申请号:SG2014005136
申请日:2010-01-26
Applicant: ADVANCED TECH MATERIALS
Inventor: CHEN TIANNIU , BILODEAU STEVEN , BOGGS KARL E , JIANG PING , KORZENSKI MICHAEL B , MIRTH GEORGE , VAN BERKEL KIM
Abstract: Compositions and methods of using said composition for removing polymeric materials from surfaces, preferably cleaning contaminant buildup from a lithography apparatus without total disassembly of said apparatus.
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公开(公告)号:SG173172A1
公开(公告)日:2011-08-29
申请号:SG2011054442
申请日:2010-01-26
Applicant: ADVANCED TECH MATERIALS
Inventor: CHEN TIANNIU , BILODEAU STEVEN , BOGGS KARL E , JIANG PING , KORZENSKI MICHAEL B , MIRTH GEORGE , VAN BERKEL KIM
Abstract: Compositions and methods of using the said composition for removing polymeric materials from surfaces, preferably cleaning contaminant buildup from a lithography apparatus without total disassembly of the said apparatus. The said compositions comprise at least one organic solvent and one non-ionic surfactant. Moreover, the pH of the said composition is about 5 to 9.
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