Abstract:
According to embodiments of the present invention, a capacitor arrangement is provided. The capacitor arrangement includes: a substrate; a first contact disposed over the substrate; a second contact disposed over the substrate; and a stack of layers, comprising: a plurality of first conductive layers; a plurality of second conductive layers; and a plurality of capacitive isolation layers; wherein the first conductive layers, the second conductive layers and the capacitive isolation layers alternate with each other such that, between two neighboring first conductive layers, one second conductive layer is disposed, and wherein the first conductive layers and the second conductive layers are isolated from each other by the capacitive isolation layers; and wherein the first conductive layers are electrically connected with the first contact and electrically isolated from the second contact and the second conductive layers are electrically connected with the second contact and electrically isolated from the first contact.
Abstract:
Various embodiments may provide a device arrangement. The device arrangement may include a substrate including a conductive layer. The device arrangement may further include a microelectromechanical systems (MEMS) device monolithically integrated with the substrate, wherein the MEMS device may be electrically coupled to the conductive layer. A cavity may be defined through the conductive layer for acoustically isolating the MEMS device from the substrate. At least one anchor structure may be defined by the conductive layer to support the MEMS device.
Abstract:
In an embodiment, a method of controlling giant piezoresistive coefficient of at least one piezoresistive element may be provided. The method may include providing an electric field to the at least one piezoresistive element to thereby create a depletion region in the at least one piezoresistive element; applying a stress onto the at least one piezoresistive element to modulate concentration and mobility of charge carriers along the at least one piezoresistive element; and varying the electric field applied onto the at least one piezoresistive element to control the giant piezoresistive coefficient of the at least one piezoresistive element. The application of stress alone may not change the giant piezoresistive coefficient, it may only change the resistance by changing the concentration and mobility of charge carriers. A piezoresistive sensor may also be provided.
Abstract:
A Through Silicon Interposer Wafer and Method of Manufacturing the Same A through silicon interposer wafer having at least one cavity formed therein for MEMS applications and a method of manufacturing the same are provided. The through silicon interposer wafer includes one or more filled silicon vias formed sufficiently proximate to the at least one cavity to provide support for walls of the at least one cavity during subsequent processing of the interposer wafer.
Abstract:
According to embodiments of the present invention, a nanowire transistor is provided. The nanowire transistor includes a carrier; a vertical nanowire structure extending from the carrier, the vertical nanowire structure comprising a channel region, and the vertical nanowire structure being made of the same material as the carrier; a gate insulator region covering at least a portion of the vertical nanowire structure; and at least one gate region covering at least a portion of the gate insulator region. In various embodiments, there is no doped junction between the channel region and the source/drain regions of the nanowire transistor.
Abstract:
A through silicon interposer wafer having at least one cavity formed therein for MEMS applications and a method of manufacturing the same are provided. The through silicon interposer wafer includes one or more filled silicon vias formed sufficiently proximate to the at least one cavity to provide support for walls of the at least one cavity during subsequent processing of the interposer wafer.
Abstract:
According to embodiments of the present invention, a thermoelectric device is provided. The thermoelectric device may include a plurality of cells, where each cell includes a first electrode including a first electrode portion and a second electrode portion; a first nanowire, wherein a first end of the first nanowire is coupled to the first electrode portion of the first electrode, the first nanowire being doped with doping atoms of a first conductivity type; and a second nanowire, wherein a first end of the second nanowire is coupled to the second electrode portion of the first electrode, the second nanowire being doped with doping atoms of a second conductivity type, the second conductivity type is different from the first conductivity type; and wherein a second end of the first nanowire is coupled to a second electrode, the second electrode coupled to an adjacent cell; wherein a second end of the second nanowire is coupled to a further second electrode, the further second electrode coupled to a further adjacent cell; and wherein at least one of the first electrode and a portion at the second end of the first nanowire and the second end of the second nanowire are silicided.
Abstract:
A method of forming a stacked silicon-germanium nanowire structure on a support substrate is disclosed. The method includes forming a stacked structure on the support substrate, the stacked structure comprising at least one channel layer and at least one interchannel layer deposited on the channel layer; forming a fin structure from the stacked structure, the fin structure comprising at least two supporting portions and a fin portion arranged there between; oxidizing the fin portion of the fin structure thereby forming the silicon-germanium nanowire being surrounded by a layer of oxide; and removing the layer of oxide to form the silicon-germanium nanowire. A method of forming a gate-all-around transistor comprising forming a stacked silicon-germanium nanowire structure that has been formed on a support substrate is also disclosed. A stacked silicon-germanium nanowire structure and a gate-all-around transistor comprising the stacked silicon-germanium nanowire structure are also disclosed.
Abstract:
A method of fabricating a sensor comprising a nanowire on a support substrate with a first semiconductor layer arranged on the support substrate is disclosed. The method comprises forming a fin structure from the first semiconductor layer, the fin structure comprising at least two supporting portions and a fin portion arranged there between; oxidizing at least the fin portion of the fin structure thereby forming the nanowire being surrounded by a first layer of oxide; and forming an insulating layer above the supporting portions; wherein the supporting portions and the first insulating layer form a microfluidic channel. A nanowire sensor is also disclosed. The nanowire sensor comprises a support substrate, a semiconducting fin structure arranged on the support substrate, the fin structure comprising at least two semiconducting supporting portions and a nanowire arranged there between; and a first insulating layer on a contact surface of the supporting portions; wherein the supporting portions and the first insulating layer form a microfluidic channel.
Abstract:
Various embodiments may provide an acoustic device. The acoustic device may include a substrate, an electrically conductive first membrane, a first spacer holding the first membrane to form a first acoustic chamber between the substrate and the first membrane. The acoustic device may additionally include an electrically conductive second membrane, a second spacer holding the second membrane to form a second acoustic chamber between the first membrane and the second membrane, and a plurality of electrical pads in electrical connection with the first membrane and the second membrane.