公开(公告)号：JPH01249830A

公开(公告)日：1989-10-05

申请号：JP7967388

申请日：1988-03-31

Applicant: AGENCY IND SCIENCE TECHN

Inventor： MATSUDA HIROO ,  OKADA SHUJI ,  NAKANISHI HACHIRO ,  KATO MASAO ,  MICHIHASHI TAKAHISA ,  INOUE TAKAHITO ,  YATSUSE KIYOSHI ,  OKADA MASAKAZU

IPC: C08G69/28 ,  C08F290/00 ,  C08F299/00 ,  C08G69/48

Abstract: PURPOSE:To obtain the subject crystal having isotropically high strength, by orienting a specific alkyldiamine perpendicularly on a surface of a substrate, depositing a diamine and a diacetylenedicarboxylic acid by vacuum evaporation and irradiating with ultraviolet ray, etc., to effect the solid-phase polymerization. CONSTITUTION:(A) An alkyldimine of formula I (n is 8-18) (e.g., diaminodecane) is deposited on (B) a substrate such as polished glass plate by vacuum evaporation at a heating temperature of the component A of 30-110 deg.C, a substrate temperature of -30-10 deg.C and a vacuum degree of 10 -10 Torr. Thereafter, (C) a diamine of formula II (R is alkyl, aryl, etc.) and (D) a diacetylenedicarboxylic acid of formula III (R is alkyl, aralkyl, etc.) are deposited on the surface by vacuum evaporation, polymerized and then irradiated with ultraviolet ray or ionizing radiation (e.g., gamma-ray of cobalt 60) to effect the solid-phase polymerization and obtain the objective crystal.

公开(公告)号：JPH08220110A

公开(公告)日：1996-08-30

申请号：JP2951195

申请日：1995-02-17

Applicant: AGENCY IND SCIENCE TECHN

Inventor： YOKOYAMA HIROSHI ,  INOUE TAKAHITO

IPC: G01B7/34 ,  G01B7/00 ,  G01N37/00 ,  G01Q10/06 ,  G01Q60/30 ,  G01Q90/00 ,  H01J37/28

Abstract: PURPOSE: To realize stabilized scanning in an electric force probe microscope by avoiding problems, e.g. contact of a probe with a sample having significant irregularities on the surface or instability in the positional control of probe, while allowing collection of much electric information at one measuring point and to observe a noisy sample with high resolution by setting a longer time constant for the detection system. CONSTITUTION: Relationship between the amplitude or phase of second harmonic vibration of a leaf spring 1 and the distance between the sample 4 and the probe 2 of a scanning electric force probe microscope is measured previously. The probe 2 is then brought close to the sample 4 and when the amplitude or phase becomes equal to a set value, electric information including surface potential, charge and permittivity is collected Subsequently the probe 2 is separated from the sample 4 and shifted to a next measuring point where the electric information is collected similarly by bringing the probe 2 close to the sample 4.