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公开(公告)号:WO2023049597A1
公开(公告)日:2023-03-30
申请号:PCT/US2022/075471
申请日:2022-08-25
Applicant: APPLE INC.
Inventor: DABRAL, Sanjay , ZHAI, Jun , YEH, Jung-Cheng , HU, Kunzhong , CAMENFORTE, Raymundo , HOFFMANN, Thomas
IPC: H01L23/538 , H01L23/528 , H01L23/522 , H01L23/00 , H01L25/065 , H01L23/66
Abstract: Multi-die structures and methods of fabrication are described. In an embodiment, a multi-die structure includes a first die, a second die, and die-to-die routing connecting the first die to the second die. The die-to-die interconnection may be monolithically integrated as a chip-level die-to-die routing, or external package-level die-to-die routing.
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公开(公告)号:WO2020112505A3
公开(公告)日:2020-06-04
申请号:PCT/US2019/062702
申请日:2019-11-21
Applicant: APPLE INC.
Inventor: DABRAL, Sanjay , ZHAI, Jun , LAI, Kwan-Yu , HU, Kunzhong , RAMACHANDRAN, Vidhya
Abstract: Stitched die packaging techniques and structures are described in which reconstituted chips are formed using wafer reconstitution and die-stitching techniques. In an embodiment, a chip includes a reconstituted chip-level back end of the line (BEOL) build-up structure (310) to connect a die set (110, 110) embedded in an inorganic gap fill material (130).
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公开(公告)号:WO2020112505A2
公开(公告)日:2020-06-04
申请号:PCT/US2019/062702
申请日:2019-11-21
Applicant: APPLE INC.
Inventor: DABRAL, Sanjay , ZHAI, Jun , LAI, Kwan-Yu , HU, Kunzhong , RAMACHANDRAN, Vidhya
IPC: H01L21/60 , H01L23/538 , H01L21/56 , H01L21/66 , H01L23/60
Abstract: Stitched die packaging techniques and structures are described in which reconstituted chips are formed using wafer reconstitution and die-stitching techniques. In an embodiment, a chip includes a reconstituted chip-level back end of the line (BEOL) build-up structure to connect a die set embedded in an inorganic gap fill material.
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公开(公告)号:WO2022066364A1
公开(公告)日:2022-03-31
申请号:PCT/US2021/048174
申请日:2021-08-30
Applicant: APPLE INC.
Inventor: DABRAL, Sanjay , CAO, Zhitao , HU, Kunzhong
IPC: H01L23/538 , H01L23/528 , H01L23/00
Abstract: Structures and methods of forming fine die-to-die interconnect routing are described. In an embodiment, a package includes a package-level RDL than spans across a die set and includes a plurality of die-to-die interconnects connecting contact pads between each die. In an embodiment, the plurality of die-to-die interconnects is embedded within one or more photoimageable organic dielectric layers.
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公开(公告)号:WO2023019070A1
公开(公告)日:2023-02-16
申请号:PCT/US2022/074392
申请日:2022-08-01
Applicant: APPLE INC.
Inventor: RAMACHANDRAN, Vidhya , DABRAL, Sanjay , JANGAM, SivaChandra , ZHAI, Jun , HU, Kunzhong
IPC: H01L23/31 , H01L23/522 , H01L23/528 , H01L23/29 , H01L21/56 , H01L21/78
Abstract: Chip sealing structures and methods of manufacture are described. In an embodiment, a chip structure includes a main body area formed of a substrate, a back-end-of-the-line (BEOL) build-up structure spanning over the substrate, and chip edge sidewalls extending from a back surface of the substrate to a top surface of the BEOL build-up structure and laterally surrounding the substrate and the BEOL build-up structure. In accordance with embodiments, the chip structure may further include a conformal sealing layer covering at least a first chip edge sidewall of the chip edge sidewalls and a portion of the top surface of the BEOL build-up structure, and forming a lip around the top surface of the BEOL build-up structure.
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公开(公告)号:WO2022191974A1
公开(公告)日:2022-09-15
申请号:PCT/US2022/016785
申请日:2022-02-17
Applicant: APPLE INC.
Inventor: DABRAL, Sanjay , NI, Chi Nung , HUANG, Long , JANGAM, SivaChandra
IPC: H01L23/58 , H01L23/00 , H01L23/528 , H01L23/66
Abstract: Chip sealing structures which can accommodate die-to-die communication are described. In an embodiment, a chip structure includes a split metallic seal structure including a lower metallic seal and an upper metallic seal with overlapping metallization layers, and a through seal interconnect navigating through the split metallic seal structure. In other embodiments, sealed box structures are described in which the die-to-die routing jumps over the seal structures, or is formed on a back side of the semiconductor substrate and connected to through silicon vias. In yet other embodiments, electromagnetic field communication structures are described to accommodate wireless die-to-die communication across sealing structures without physical wiring.
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公开(公告)号:WO2021158419A1
公开(公告)日:2021-08-12
申请号:PCT/US2021/015441
申请日:2021-01-28
Applicant: APPLE INC.
Inventor: DABRAL, Sanjay , CAO, Zhitao , HU, Kunzhong , ZHAI, Jun
IPC: H01L23/50 , H01L23/538
Abstract: Electronic package structures and systems are described in which a 3D interconnect structure is integrated into a package redistribution layer and/or chiplet for power and signal delivery to a die. Such structures may significantly improve input output (IO) density and routing quality for signals, while keeping power delivery feasible.
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公开(公告)号:WO2019199472A1
公开(公告)日:2019-10-17
申请号:PCT/US2019/024647
申请日:2019-03-28
Applicant: APPLE INC.
Inventor: DABRAL, Sanjay , KILIC, Bahattin , ZHAO, Jie-Hua , HU, Kunzhong , RYU, Suk-Kyu
IPC: H01L23/00 , H01L25/065 , G06F13/40 , G06F15/78
Abstract: Multi-chip systems (100) and structures for modular scaling are described. In some embodiments an interfacing bar (150) is utilized to couple adjacent chips (102, 104). For example, a communication bar (150) may utilized to coupled logic chips (104), and memory bar (150) may be utilized to couple multiple memory chips (102) to a logic chip (104).
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