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1.发明授权Electron probe X-ray analyzer wherein the emitted X-radiation passes through the objective lens 失效电子探针X射线分析仪，其中所发射的X射线通过物镜
公开(公告)号：US3107297A
公开(公告)日：1963-10-15
申请号：US5264060
申请日：1960-08-29
Applicant: APPLIED RES LAB INC
Inventor： WITTRY DAVID B
IPC: G01N23/225 , H01J37/20 , H01J37/22 , H01J37/252
CPC classification number: H01J37/228 , G01N23/225 , H01J37/20 , H01J37/252
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