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公开(公告)号:US20230050613A1
公开(公告)日:2023-02-16
申请号:US17792464
申请日:2020-12-15
Applicant: ASML NETHERLANDS B.V.
Inventor: Ties Wouter VAN DER WOORD , Volker Dirk HILDENBRAND , Inci DONMEZ NOYAN , Adrianus Johannes Maria GIESBERS , Alexander Ludwig KLEIN
Abstract: A pellicle membrane for a lithographic apparatus, the membrane including a matrix including a plurality of inclusions distributed therein. A method of manufacturing the pellicle membrane, a lithographic apparatus including the pellicle membrane, a pellicle assembly for use in a lithographic apparatus including the membrane, as well as the use of the pellicle membrane in a lithographic apparatus or method.
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公开(公告)号:US20230168577A1
公开(公告)日:2023-06-01
申请号:US17922768
申请日:2021-04-21
Applicant: ASML NETHERLANDS B.V.
Inventor: Zomer Silvester HOUWELING , Volker Dirk HILDENBRAND , Alexander Ludwig KLEIN , Paul Alexander VERMEULEN
CPC classification number: G03F1/64 , G02B5/09 , G02B5/208 , G02B5/0891
Abstract: An optical element for a lithographic apparatus, the optical element including an anchor layer selected to support a top layer having self-terminating growth in an operating lithographic apparatus or plasma containing environment. Also described is a method of manufacturing an optical element, the method including depositing a top layer on anchor layer via exposure to plasma, preferably electromagnetically induced plasma. Lithographic apparatuses including such optical elements are also described.
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公开(公告)号:US20240411233A1
公开(公告)日:2024-12-12
申请号:US18699358
申请日:2022-10-07
Applicant: ASML NETHERLANDS B.V.
Inventor: Gosse Charles DE VRIES , Sjoerd Nicolaas Lambertus DONDERS , Franciscus Johannes Joseph JANSSEN , Evgenia KURGANOVA , Abraham Jan WOLF , Ties Jan Willem BAKKER , Volker Dirk HILDENBRAND , Paul Alexander VERMEULEN , Michael ENGEL , Bernardus Antonius Johannes LUTTIKHUIS , Ronald VAN DER HAM , Jeroen Peterus Johannes VAN LIPZIG
Abstract: A lithographic apparatus includes: an illumination system configured to condition a radiation beam; a support structure constructed to support a reticle and pellicle assembly for receipt of the radiation beam conditioned by the illumination system; a substrate table constructed to support a substrate; a projection system configured to receive the radiation beam from the reticle-pellicle assembly and to project it onto the substrate; and a heating system configured to heat a pellicle of the reticle-pellicle assembly supported by the support structure. A method for using a reticle-pellicle assembly including: illuminating the reticle-pellicle assembly with a radiation beam so as to form a patterned image on a substrate; and heating the pellicle of the reticle-pellicle assembly using a separate heat source.
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