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公开(公告)号：US20170242348A1
公开(公告)日：2017-08-24
申请号：US15589705
申请日：2017-05-08
Applicant: ASML NETHERLANDS B.V.
Inventor： Michel RIEPEN , Christiaan Alexander HOOGENDAM , Paulus Martinus Maria LIEBREGTS , Ronald VAN DER HAM , Wilhelmus Franciscus Johannes SIMONS , Daniël Jozef Maria DIRECKS , Paul Petrus Joannes BERKVENS , Eva MONDT , Gert-Jan Gerardus Johannes Thomas BRANDS , Koen STEFFENS , Han Henricus Aldegonda LEMPENS , Mathieus Anna Karel VAN LIEROP , Christophe DE METSENAERE , Marcio Alexandre Cano MIRANDA , Patrick Johannes Wilhelmus SPRUYTENBURG , Joris Johan Anne-Marie VERSTRAETE , Franciscus Johannes Joseph JANSSEN
IPC: G03F7/20
CPC classification number: G03F7/70866 , G03F7/70341
Abstract: A liquid confinement system for use in immersion lithography is disclosed in which the meniscus of liquid between the liquid confinement system and the substrate is pinned substantially in place by a meniscus pinning feature. The meniscus pinning feature comprises a plurality of discrete outlets arranged in a polygonal shape.
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公开(公告)号：US20160033876A1
公开(公告)日：2016-02-04
申请号：US14885775
申请日：2015-10-16
Applicant: ASML NETHERLANDS B.V.
Inventor： Hans JANSEN , Marco Koert STAVENGA , Jacobus Johannus Leonardus Hendricus VERSPAY , Franciscus Johannes Joseph JANSSEN , Anthonie KUIJPER
IPC: G03F7/20
CPC classification number: G03F7/70858 , G03F7/2041 , G03F7/70341
Abstract: An immersion liquid is provided comprising an ion-forming component, e.g. an acid or a base, which has a relatively high vapor pressure. Also provided are lithography processes and lithography systems using the immersion liquid.
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公开(公告)号：US20240411233A1
公开(公告)日：2024-12-12
申请号：US18699358
申请日：2022-10-07
Applicant: ASML NETHERLANDS B.V.
Inventor： Gosse Charles DE VRIES , Sjoerd Nicolaas Lambertus DONDERS , Franciscus Johannes Joseph JANSSEN , Evgenia KURGANOVA , Abraham Jan WOLF , Ties Jan Willem BAKKER , Volker Dirk HILDENBRAND , Paul Alexander VERMEULEN , Michael ENGEL , Bernardus Antonius Johannes LUTTIKHUIS , Ronald VAN DER HAM , Jeroen Peterus Johannes VAN LIPZIG
Abstract: A lithographic apparatus includes: an illumination system configured to condition a radiation beam; a support structure constructed to support a reticle and pellicle assembly for receipt of the radiation beam conditioned by the illumination system; a substrate table constructed to support a substrate; a projection system configured to receive the radiation beam from the reticle-pellicle assembly and to project it onto the substrate; and a heating system configured to heat a pellicle of the reticle-pellicle assembly supported by the support structure. A method for using a reticle-pellicle assembly including: illuminating the reticle-pellicle assembly with a radiation beam so as to form a patterned image on a substrate; and heating the pellicle of the reticle-pellicle assembly using a separate heat source.
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公开(公告)号：US20180173116A1
公开(公告)日：2018-06-21
申请号：US15568122
申请日：2016-04-04
Applicant: ASML Netherlands B.V.
Inventor： Adrianus Hendrik KOEVOETS , Erik Johan ARLEMARK , Sander Catharina Reinier DERKS , Sjoerd Nicolaas Lambertus DONDERS , Wilfred Edward ENDENDIJK , Franciscus Johannes Joseph JANSSEN , Raymond Wilhelmus Louis LAFARRE , Leon Martin LEVASIER , Jim Vincent OVERKAMP , Nicolaas TEN KATE , Jacobus Cornelis Gerardus VAN DER SANDEN
CPC classification number: G03F7/70875 , G03F7/2041 , G03F7/70258 , G03F7/70783 , H01L21/67098 , H01L21/683
Abstract: A lithographic apparatus comprising a projection system configured to project a patterned radiation beam to form an exposure area on a substrate held on a substrate table, the lithographic apparatus further comprising a cooling apparatus (40) for cooling the substrate, wherein the cooling apparatus comprises a cooling element (42, 44) located above the substrate table and adjacent to the exposure area, the cooling element being configured to remove heat from the substrate.
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公开(公告)号：US20150056559A1
公开(公告)日：2015-02-26
申请号：US14504130
申请日：2014-10-01
Applicant: ASML NETHERLANDS B.V.
Inventor： Hans JANSEN , Marco Koert STAVENGA , Jacobus Johannus Leonardus Hendricus VERSPAY , Franciscus Johannes Joseph JANSSEN , Anthonie KUIJPER
IPC: G03F7/20
CPC classification number: G03F7/70858 , G03F7/2041 , G03F7/70341
Abstract: An immersion liquid is provided comprising an ion-forming component, e.g. an acid or a base, which has a relatively high vapor pressure. Also provided are lithography processes and lithography systems using the immersion liquid.
Abstract translation: 提供了一种浸没液体，其包括离子形成组分，例如 酸或碱，其具有较高的蒸气压。 还提供了使用浸液的光刻工艺和光刻系统。
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Patent Agency Ranking
公开(公告)号：US20170176877A1
公开(公告)日：2017-06-22
申请号：US15451358
申请日：2017-03-06
Applicant: ASML NETHERLANDS B.V.
Inventor： Manish RANJAN , Carlo Cornelis Maria LUIJTEN , Franciscus Johannes Joseph JANSSEN , Maksym CHERNYSHOV
IPC: G03F7/20
CPC classification number: G03F7/70875 , G03F7/70633 , G03F7/70716 , G03F7/70933
Abstract: A lithographic apparatus includes a substrate table constructed to hold a substrate, a projection system configured to project a patterned radiation beam through an opening and onto a target portion of the substrate, and a conduit having an outlet in the opening. The conduit is configured to deliver gas to the opening. The lithographic apparatus includes a temperature control apparatus disposed in a space between the projection system and the substrate table. The temperature control device is configured to control the temperature of the gas in the space after the gas passes through the opening.
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公开(公告)号：US20210063898A1
公开(公告)日：2021-03-04
申请号：US17098073
申请日：2020-11-13
Applicant: ASML NETHERLANDS B.V.
Inventor： Theodorus Petrus Maria CADEE , Johannes Henricus Wilhelmus JACOBS , Nicolaas TEN KATE , Erik Roelof LOOPSTRA , Aschwin Lodewijk Hendricus Johannes VAN MEER , Jeroen Johannes Sophia Maria MERTENS , Christianus Gerardus Maria DE MOL , Marcel Johannus Elisabeth Hubertus MUITJENS , Antonius Johannus VAN DER NET , Joost Jeroen OTTENS , Johannes Anna QUAEDACKERS , Maria Elisabeth REUHMAN-HUISKEN , Marco Koert STAVENGA , Patricius Aloysius Jacobus TINNEMANS , Martinus Cornelis Maria VERHAGEN , Jacobus Johannus Leonardus Hendricus VERSPAY , Frederik Eduard DE JONG , Koen GOORMAN , Boris MENCHTCHIKOV , Herman BOOM , Stoyan NIHTIANOV , Richard MOERMAN , Martin Frans Pierre SMEETS , Bart Leonard Peter SCHOONDERMARK , Franciscus Johannes Joseph JANSSEN , Michel RIEPEN
IPC: G03F7/20
Abstract: A lithographic apparatus is described having a liquid supply system configured to at least partly fill a space between a projection system of the lithographic apparatus and a substrate with liquid, a barrier member arranged to substantially contain the liquid within the space, and a heater.
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公开(公告)号：US20190235397A1
公开(公告)日：2019-08-01
申请号：US16376535
申请日：2019-04-05
Applicant: ASML NETHERLANDS B.V.
Inventor： Theodorus Petrus Maria CADEE , Johannes Henricus Wilhelmus JACOBS , Nicolaas TEN KATE , Erik Roelof LOOPSTRA , Aschwin Lodewijk Hendricus Johannes VAN MEER , Jeroen Johannes Sophia Maria MERTENS , Christianus Gerardus Maria DE MOL , Marcel Johannus Elisabeth Hubertus MUITJENS , Antonius Johannus VAN DER NET , Joost Jeroen OTTENS , Johannes Anna QUAEDACKERS , Maria Elisabeth REUHMAN-HUISKEN , Marco Koert STAVENGA , Patricius Aloysius Jacobus TINNEMANS , Martinus Cornelis Maria VERHAGEN , Jacobus Johannus Leonardus Hendricus VERSPAY , Frederik Eduard DE JONG , Koen GOORMAN , Boris MENCHTCHIKOV , Herman BOOM , Stoyan NIHTIANOV , Richard MOERMAN , Martin Frans Pierre SMEETS , Bart Leonard Peter SCHOONDERMARK , Franciscus Johannes Joseph JANSSEN , Michel RIEPEN
IPC: G03F7/20
CPC classification number: G03F7/70808 , G03F7/70341 , G03F7/70841 , G03F7/70875
Abstract: A lithographic apparatus is described having a liquid supply system configured to at least partly fill a space between a projection system of the lithographic apparatus and a substrate with liquid, a barrier member arranged to substantially contain the liquid within the space, and a heater.
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公开(公告)号：US20160225477A1
公开(公告)日：2016-08-04
申请号：US14917623
申请日：2014-09-24
Applicant: ASML NETHERLANDS B.V.
Inventor： Vadim Yevgenyevich BANINE , Peturs Rutgerus BARTRAIJ , Ramon Pascal VAN GORKOM , Lucas Johannes Peter AMENT , Pieter Willem Herman DE JAGER , Gosse Charles DE VRIES , Rilpho Ludovicus DONKER , Wouter Joep ENGELEN , Olav Waldemar Vladimir FRIJNS , Leonardus Adrianus Gerardus GRIMMINCK , Andelko KATALENIC , Erik Roelof LOOPSTRA , Han-Kwang NIENHUYS , Andrey Alexandrovich NIKIPELOV , Michael Jozef Mathijs RENKENS , Franciscus Johannes Joseph JANSSEN , Borgert KRUIZINGA
Abstract: A delivery system for use within a lithographic system. The beam delivery system comprises optical elements arranged to receive a radiation beam from a radiation source and to reflect portions of radiation along one or more directions to form a one or more branch radiation beams for provision to one or more tools.
Abstract translation: 用于光刻系统的传送系统。 光束传送系统包括被配置为从辐射源接收辐射束并且沿着一个或多个方向反射辐射部分的光学元件，以形成用于提供给一个或多个工具的一个或多个分支辐射束。
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公开(公告)号：US20180196361A1
公开(公告)日：2018-07-12
申请号：US15742168
申请日：2016-06-14
Applicant: ASML Netherlands B.V.
Inventor： Franciscus Johannes Joseph JANSSEN , Johannes Paul Marie DE LA ROSETTE , Edwin Cornelis KADIJK , Nicolas Alban LALLEMANT , Jan LIEFOOGHE , Markus Rolf Werner MATTHES , Marcel Johannus Elisabeth MUITJENS , Hubert Matthieu Richard STEIJNS , André Gillis VAN DE VELDE , Marinus Aart VAN DEN BRINK
CPC classification number: G03F7/70891 , F28C1/08 , G03F7/70025 , G03F7/70033 , G03F7/708 , G03F7/70858 , H01S3/036 , H01S3/038 , H01S3/0407 , H01S3/041 , H01S3/2232 , H01S3/2308 , H05G2/008
Abstract: A lithographic apparatus comprising an illumination system configured to condition a radiation beam, a support structure constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table constructed to hold a substrate, and a projection system configured to project the patterned radiation beam onto the substrate, the lithographic apparatus being provided with a first cooling fluid circuit which is configured to cool components to a first temperature, and provided with a second cooling fluid circuit which is configured to cool components to a second temperature that is lower than the first temperature.
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