INSPECTION METHOD AND APPARATUS
    1.
    发明申请
    INSPECTION METHOD AND APPARATUS 审中-公开
    检验方法和装置

    公开(公告)号:WO2010049348A3

    公开(公告)日:2011-03-17

    申请号:PCT/EP2009063918

    申请日:2009-10-22

    CPC classification number: G03F7/70625

    Abstract: In a method for determining one or more properties of a substrate, scatterometry spectra can be measured from one or more targets on the substrate. Reconstructions of each of said spectra can be performed to derive one or more values for the property of the substrate, by comparing representations of each of the measured spectra with one or more modeled representations of spectra calculated using variable parameter values. At least one parameter in the reconstruction for each spectrum can be linked to the value of the parameter used in the reconstruction for a different spectrum.

    Abstract translation: 在确定衬底的一个或多个特性的方法中,可以从衬底上的一个或多个靶测量散射光谱。 可以通过将每个测量光谱的表示与使用可变参数值计算的光谱的一个或多个建模表示进行比较,来执行每个所述光谱的重建以导出衬底性质的一个或多个值。 每个频谱的重建中至少有一个参数可以链接到在不同频谱的重构中使用的参数的值。

    PROJECTION SYSTEM, MIRROR AND RADIATION SOURCE FOR A LITHOGRAPHIC APPARATUS
    2.
    发明申请
    PROJECTION SYSTEM, MIRROR AND RADIATION SOURCE FOR A LITHOGRAPHIC APPARATUS 审中-公开
    投影系统,镜像和放射源用于光刻设备

    公开(公告)号:WO2014114405A3

    公开(公告)日:2014-09-25

    申请号:PCT/EP2013076310

    申请日:2013-12-12

    Abstract: Disclosed is a system configured to project a beam of radiation onto a target portion of a substrate within a lithographic apparatus. The system comprises a mirror (510) having an actuator (500) for positioning the mirror and/or configuring the shape of the mirror, the actuator also providing active damping to the mirror, and a controller (515a, 515b) for generating actuator control signals for control of said actuator(s). A first coordinate system is used for control of said actuator(s) when positioning said mirror and/or configuring the shape of said mirror and a second coordinate system is used for control of said actuator(s) when providing active damping to said mirror.

    Abstract translation: 公开了一种被配置为将光束投射到光刻设备内的基板的目标部分上的系统。 该系统包括具有用于定位反射镜的致动器(500)和/或配置反射镜的形状的反射镜(510),致动器还向反射镜提供主动阻尼,以及用于产生致动器控制的控制器(515a,515b) 用于控制所述致动器的信号。 当定位所述反射镜和/或构造所述反射镜的形状时,第一坐标系用于控制所述致动器,并且当向所述反射镜提供主动阻尼时,使用第二坐标系来控制所述致动器。

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