公开(公告)号：WO2022040468A1

公开(公告)日：2022-02-24

申请号：PCT/US2021/046772

申请日：2021-08-19

Applicant: APPLE INC.

Inventor： HILL, Jeffrey T. ,  BISMUTO, Alfredo ,  SARMIENTO, Tomas

IPC: H01S5/187

Abstract: Configurations for an edge-generated vertical emission laser that vertically emits light and fabrication methods of the edge-generated vertical emission laser are disclosed. The edge-generated vertical emission laser may include a distributed feedback (DFB) laser structure, a grating coupler, and contact layers. Light may propagate through the DFB laser structure, approximately parallel to the top surface of the edge-generated vertical emission laser and be directed by the grating coupler toward the top surface of the edge-generated vertical emission laser. The light may vertically emit from the edge-generated vertical emission laser approximately perpendicular to the top surface of the edge-generated vertical emission laser. Additionally, the contact layers may be n-metal and p-metal, which may be located on the same side of the edge-generated vertical emission laser. These features of the edge-generated vertical emission laser may facilitate ease of testing and increased options for packaging.

公开(公告)号：EP4200947A1

公开(公告)日：2023-06-28

申请号：EP21773920.0

申请日：2021-08-19

Applicant: Apple Inc.

Inventor： HILL, Jeffrey T. ,  BISMUTO, Alfredo ,  SARMIENTO, Tomas

IPC: H01S5/187

公开(公告)号：EP4538680A1

公开(公告)日：2025-04-16

申请号：EP24202213.5

申请日：2024-09-24

Applicant: Apple Inc.

Inventor： ARBORE, Mark A. ,  MILES, Alexander A. ,  TERREL, Matthew A. ,  HWANG, Victoria ,  STEVEN, Samuel ,  RIDDER, Trent D. ,  HILL, Jeffrey T. ,  MINSHULL, Sinclair A.

IPC: G01N21/31 ,  A61B5/1455 ,  G01N21/47 ,  G01N21/49

Abstract: The disclosure relates to embodiments of optical measurement systems that are configured to perform spectroscopic measurements. The optical measurement systems are configured to provide compact arrangements for introducing light into a sample and collecting light returned from the sample. Reducing the size of the launch and/or collection architecture of an optical measurement system may make the overall optical measurement system smaller, thereby providing flexibility in integrating an optical measurement system into various form factors.