公开(公告)号：US09685757B2

公开(公告)日：2017-06-20

申请号：US14588608

申请日：2015-01-02

Applicant: Applied Optoelectronics, Inc.

Inventor： Guipeng Luo ,  Klaus Alexander Anselm ,  Hung-Lun Chang

IPC: G01J1/42 ,  H01S5/00 ,  G01J1/04

CPC classification number: H01S5/0014 ,  G01J1/0411 ,  G01J1/0451 ,  G01J1/4257

Abstract: A dual testing system and method is used to perform both optical power and wavelength measurements on laser light emitted from a laser diode, such as a chip-on-submount (COS) laser diode or a laser diode in a bar laser. A testing fixture may be used to facilitate both measurements by simultaneously detecting the light for performing a first test including the optical power measurement(s) and reflecting the light for performing a second test including the wavelength measurement(s). The testing fixture may include an angled photodetector and an optical coupling system such as a collimating lens, a focal lens and an optical waveguide. The testing fixture may be electrically connected to an optical power testing module, such as a light-current-voltage (LIV) testing module, for performing the optical power measurement(s) and may be optically coupled to a wavelength measurement module, such as an optical spectrum analyzer (OSA) for performing the wavelength measurement(s).

公开(公告)号：US20160197453A1

公开(公告)日：2016-07-07

申请号：US14588608

申请日：2015-01-02

Applicant: Applied Optoelectronics, Inc.

Inventor： Guipeng Luo ,  Klaus Alexander Anselm ,  Hung-Lun Chang

IPC: H01S5/00 ,  G01M11/00

CPC classification number: H01S5/0014 ,  G01J1/0411 ,  G01J1/0451 ,  G01J1/4257

Abstract: A dual testing system and method is used to perform both optical power and wavelength measurements on laser light emitted from a laser diode, such as a chip-on-submount (COS) laser diode or a laser diode in a bar laser. A testing fixture may be used to facilitate both measurements by simultaneously detecting the light for performing a first test including the optical power measurement(s) and reflecting the light for performing a second test including the wavelength measurement(s). The testing fixture may include an angled photodetector and an optical coupling system such as a collimating lens, a focal lens and an optical waveguide. The testing fixture may be electrically connected to an optical power testing module, such as a light-current-voltage (LIV) testing module, for performing the optical power measurement(s) and may be optically coupled to a wavelength measurement module, such as an optical spectrum analyzer (OSA) for performing the wavelength measurement(s).

Abstract translation: 双重测试系统和方法用于对激光二极管发射的激光进行光功率和波长测量，如激光二极管芯片（COS）激光二极管或激光二极管。 可以使用测试夹具来同时检测用于执行包括光功率测量的第一测试的光并反射用于进行包括波长测量的第二测试的光的测量。 测试夹具可以包括成角度的光电检测器和诸如准直透镜，聚焦透镜和光波导之类的光耦合系统。 测试夹具可以电连接到诸如光电压（LIV）测试模块的光功率测试模块，用于执行光功率测量，并且可以光学耦合到波长测量模块，例如 用于执行波长测量的光谱分析仪（OSA）。