公开(公告)号：WO2010106533A2

公开(公告)日：2010-09-23

申请号：PCT/IL2010/000174

申请日：2010-03-03

Applicant: BRIGHTVIEW SYSTEMS LTD. ,  FINAROV, Moshe

Inventor： FINAROV, Moshe

IPC: G01B9/08

CPC classification number: G01B11/0625 ,  G01B11/303 ,  G01N21/55 ,  G01N21/8422

Abstract: A method for accurate determination of optical parameters of a stack of thin films with at least one of the films being an opaque film. The method includes measurement of the reflected or transmitted through the stack illumination and mutual correlation of the determined thin film parameters.

Abstract translation: 用于精确确定薄膜堆叠的光学参数的方法，其中至少一个薄膜是不透明薄膜。 该方法包括测量通过堆叠照明的反射或透射以及所确定的薄膜参数的相互关联。

公开(公告)号：WO2010079474A1

公开(公告)日：2010-07-15

申请号：PCT/IL2009/001211

申请日：2009-12-23

Applicant: BRIGHTVIEW SYSTEMS LTD ,  NOY, Noam ,  LIPSON, Ariel ,  FINAROV, Moshe

Inventor： NOY, Noam ,  LIPSON, Ariel ,  FINAROV, Moshe

IPC: G01N21/84

CPC classification number: G01N21/8422 ,  H02S50/15

Abstract: A method of a photovoltaic panel (104) quality control, said method comprising: enabling a relative movement in at least one direction (112) between the photovoltaic panel (104) and a low-resolution scanning imaging unit (132) and capturing successive two-dimensional frames of the scanned area; analyzing the aquired image frames for presence of thin film production defects (144) and communicating to a high resolution image scanning unit (136) locations of said production defects; enabling a relative movement (148) between the photovoltaic panel and the high resolution scanning unit said, movement following the low-resolution unit movement and at least one additional direction parallel to the photovoltaic panel movement direction to aquire and classify the thin film production defects communicated by the low resolution scanning unit; and wherein the low and high resolution scanning units move simultaneously with the same speed (124) across the photovoltaic panel and the speed of the high resolution scanning unit moving in the direction parallel to the thin film movement direction is different from the speed at which the photovoltaic panel moves.

Abstract translation: 一种光伏面板（104）质量控制的方法，所述方法包括：实现光伏面板（104）和低分辨率扫描成像单元（132）之间的至少一个方向（112）的相对运动，并捕获连续的两个 扫描区域的三维帧; 分析所述彩色图像帧以存在薄膜生产缺陷（144）并与所述生产缺陷的位置的高分辨率图像扫描单元（136）通信; 使得能够在光伏面板和高分辨率扫描单元之间进行相对运动（148），所述运动遵循低分辨率单元运动和平行于光伏面板运动方向的至少一个附加方向，以产生并分类所传播的薄膜生产缺陷 由低分辨率扫描单元; 并且其中所述低分辨率和高分辨率扫描单元以相同的速度（124）同时移动穿过所述光伏面板，并且所述高分辨率扫描单元在与所述薄膜移动方向平行的方向上移动的速度不同于 光伏面板移动。

公开(公告)号：WO2010007617A3

公开(公告)日：2010-01-21

申请号：PCT/IL2009/000684

申请日：2009-07-09

Applicant: BRIGHTVIEW SYSTEMS LTD. ,  FINAROV, Moshe

Inventor： FINAROV, Moshe

IPC: G01N21/95 ,  G01N21/31

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic illumination source. The source forms on the thin film a continuous illuminated line. Discrete sampled points located on the illuminated line are imaged onto a two dimensional optical switch. A concordance look-up-table between the coordinates of the above sampled points on the thin film and their coordinates on the two dimensional optical switch are generated. The spectral composition of the illumination reflected by the sampled points is determined and photovoltaic thin film parameters applicable to the quality control are derived from the spectral composition of reflected or transmitted by the photovoltaic thin film illumination.

公开(公告)号：EP2212680A2

公开(公告)日：2010-08-04

申请号：EP09787463.0

申请日：2009-07-09

Applicant: Brightview Systems Ltd.

Inventor： FINAROV, Moshe

IPC: G01N21/95 ,  G01N21/31

CPC classification number: G01N21/8422 ,  G01N21/31 ,  G01N21/6489 ,  G01N21/8901 ,  G01N2021/3568 ,  G01N2021/8908 ,  G01N2201/0826 ,  G01N2201/0833 ,  G01N2201/1085

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic illumination source. The source forms on the thin film a continuous illuminated line. Discrete sampled points located on the illuminated line are imaged onto a two dimensional optical switch. A concordance look-up-table between the coordinates of the above sampled points on the thin film and their coordinates on the two dimensional optical switch are generated. The spectral composition of the illumination reflected by the sampled points is determined and photovoltaic thin film parameters applicable to the quality control are derived from the spectral composition of reflected or transmitted by the photovoltaic thin film illumination.

公开(公告)号：EP2386059A1

公开(公告)日：2011-11-16

申请号：EP09810749.3

申请日：2009-12-23

Applicant: Brightview Systems Ltd.

Inventor： NOY, Noam ,  LIPSON, Ariel ,  FINAROV, Moshe

IPC: G01N21/84

CPC classification number: G01N21/8422 ,  H02S50/15

Abstract: A method of a photovoltaic panel (104) quality control, said method comprising: enabling a relative movement in at least one direction (112) between the photovoltaic panel (104) and a low-resolution scanning imaging unit (132) and capturing successive two-dimensional frames of the scanned area; analyzing the aquired image frames for presence of thin film production defects (144) and communicating to a high resolution image scanning unit (136) locations of said production defects; enabling a relative movement (148) between the photovoltaic panel and the high resolution scanning unit said, movement following the low-resolution unit movement and at least one additional direction parallel to the photovoltaic panel movement direction to aquire and classify the thin film production defects communicated by the low resolution scanning unit; and wherein the low and high resolution scanning units move simultaneously with the same speed (124) across the photovoltaic panel and the speed of the high resolution scanning unit moving in the direction parallel to the thin film movement direction is different from the speed at which the photovoltaic panel moves.