PROBE STATION WITH LOW NOISE CHARACTERISTICS
    1.
    发明申请
    PROBE STATION WITH LOW NOISE CHARACTERISTICS 审中-公开
    低噪声特征的探测站

    公开(公告)号:WO2004044949A3

    公开(公告)日:2004-10-14

    申请号:PCT/US0333842

    申请日:2003-10-24

    Abstract: A cable (30) includes an inner conductor (50), an inner dielectric (52), and a guard conductor (56), where the inner dielectric (52) is between the inner conductor (50) and the guard conductor (56). The cable also includes an outer dielectric (58), and a shield conductor (62), where the outer dielectric (58) is between the guard conductor (56) and the shield conductor (62). The cable further includes an additional layer of material between the outer dielectric and the shield conductor (30) of suitable composition for reducing triboelectric current generation between the outer dielectric (58) and the shield conductor (62) to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

    Abstract translation: 电缆(30)包括内部导体(50),内部电介质(52)和保护导体(56),其中内部电介质(52)在内部导体(50)和保护导体(56)之间, 。 电缆还包括外部电介质(58)和屏蔽导体(62),其中外部电介质(58)在保护导体(56)和屏蔽导体(62)之间。 电缆还包括在外部电介质和屏蔽导体(30)之间的适当组合物的附加材料层,用于减少外部电介质(58)和屏蔽导体(62)之间产生的摩擦电流,小于将发生的摩擦电流 外部电介质和屏蔽导体彼此直接相连。

    Membrane probing system
    2.
    发明专利

    公开(公告)号:AU5224499A

    公开(公告)日:2001-02-13

    申请号:AU5224499

    申请日:1999-07-21

    Abstract: A substrate (200), preferably constructed of a ductile material and a tool (210) having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression (216) can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material is located within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.

    Probe station with low noise characteristics

    公开(公告)号:AU2003291650A8

    公开(公告)日:2004-06-03

    申请号:AU2003291650

    申请日:2003-10-24

    Abstract: A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

    PROBE STATION WITH LOW NOISE CHARACTERISTICS

    公开(公告)号:AU2003291650A1

    公开(公告)日:2004-06-03

    申请号:AU2003291650

    申请日:2003-10-24

    Abstract: A cable includes an inner conductor, an inner dielectric, and a guard conductor, where the inner dielectric is between the inner conductor and the guard conductor. The cable also includes an outer dielectric, and a shield conductor, where the outer dielectric is between the guard conductor and the shield conductor. The cable further includes an additional layer of material between the outer dielectric and the shield conductor of suitable composition for reducing triboelectric current generation between the outer dielectric and the shield conductor to less than that which would occur were the outer dielectric and the shield conductor to directly adjoin each other.

    MEMBRANE PROBING SYSTEM
    6.
    发明公开
    MEMBRANE PROBING SYSTEM 审中-公开
    干簧管传感器系统

    公开(公告)号:EP1210208A4

    公开(公告)日:2005-07-06

    申请号:EP99937404

    申请日:1999-07-21

    CPC classification number: G01R1/06744 G01R1/0735 G01R3/00

    Abstract: A substrate (200), preferably constructed of a ductile material and a tool (210) having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression (216) can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material is located within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.

Patent Agency Ranking