Abstract:
To improve the precision operation of a ''''Coulter Counter'''' particle analyzer, which is subject to small magnitude, yet statistically important input power voltage changes that are random in nature and magnitude, the current applied to the microscopic sensing aperture and the voltage applied to the threshold circuits, which monitor and respond to the amplitudes of the particle signals derived from the sensing aperture, are caused to track one another; so that variations of input power do not adversely affect the precision output of the particle analyzer. In series with both the sensing aperture circuit and the threshold circuits is the power supply, a polarity control switch and a current sensing resistor. Interposed between the current sensing resistor and the threshold circuits is an absolute value amplifier, which applies to the threshold circuits a voltage proportional to the aperture current. Additionally, the output from the absolute value amplifier is compared with an arbitrary voltage reference, and the result of the comparison is employed to determine both the aperture current and the threshold voltage.
Abstract:
Electronic particle study apparatus for studying particles, particularly those whose density and size make difficult maintenance of a dispersion in a fluid medium and which permits total sample recovery. A pair of chambers is provided through which a continuously filtered electrolyte flows. The chambers are separated by a Coulter type scanning aperture means and drip chamber means is provided for electrically isolating one of said chambers. A recirculating system for supplying filtered electrolyte to the chambers including storage means, recirculating means, pump means and filter means, for moving of the electrolyte into and out of the chambers and for collecting the particulate sample.