EDDY CURRENT SENSOR, POLISHING APPARATUS, AND FILM THICKNESS DETECTION METHOD

    公开(公告)号:US20240210353A1

    公开(公告)日:2024-06-27

    申请号:US18545448

    申请日:2023-12-19

    CPC classification number: G01N27/9006 G01N27/023 G01N27/9046 H01L22/12

    Abstract: The eddy current sensor includes a first detector that detects an eddy current generated in a semiconductor wafer WH and a second detector that detects the eddy current. The first detector includes a first exciting coil configured to generate the eddy current and a first detecting coil configured to detect the eddy current. The first exciting coil and the first detecting coil are air-core coils. The second detector includes second exciting coil configured to generate the eddy current and second detecting coil configured to detect the eddy current. The second exciting coil and the second detecting coil are coils with a magnetic core.

    OUTPUT SIGNAL PROCESSING APPARATUS FOR EDDY CURRENT SENSOR

    公开(公告)号:US20220063056A1

    公开(公告)日:2022-03-03

    申请号:US17410099

    申请日:2021-08-24

    Abstract: An eddy current sensor has an exciting coil and a detection coil. A holding circuit holds reference data indicating a characteristic of an output signal output from the detection coil at a reference state and outputs the reference data at a state other than the reference state. A pseudo signal generating circuit generates and outputs a balance coil pseudo signal corresponding to the output signal output from the detection coil at the reference state from the reference data output from the holding circuit. A bridge circuit, at the state other than the reference state, receives the output signal output from the detection coil and the balance coil pseudo signal and outputs a bridge output signal corresponding to a difference between the output signal and the balance coil pseudo signal as a bridge output signal.

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