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公开(公告)号：FR2737568A1
公开(公告)日：1997-02-07
申请号：FR9509411
申请日：1995-08-02
Applicant: ESSILOR INT
Inventor： MAZUET DENIS , BERTRAND PATRICK , PHAN DO QUYEN , MOHR WERNER
Abstract: A fringe deflectometry apparatus including lighting means (1, 2, 3, 4, 5, 6, 7, 8) for illuminating an optical component to be measured using radiation having a known wavefront; deflectometric means (14) for measuring the deflection of the radiation after it has been reflected or transmitted by said optical component to be measured; and means (25, 26) for materialising a reference beam. The apparatus further includes means (27) for measuring the transverse aberration of the reference beam after it has been reflected or transmitted by said optical component to be measured. A deflectometry method using such an apparatus enables an absolute phase reference to be provided.
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公开(公告)号：ES2154413T3
公开(公告)日：2001-04-01
申请号：ES96925778
申请日：1996-07-12
Applicant: ESSILOR INT
Inventor： MAZUET DENIS , BERTRAND PATRICK , PHAN DO QUYEN , MOHR WERNER
IPC: G01M11/02
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公开(公告)号：FR2737568B1
公开(公告)日：1997-09-26
申请号：FR9509411
申请日：1995-08-02
Applicant: ESSILOR INT
Inventor： MAZUET DENIS , BERTRAND PATRICK , PHAN DO QUYEN , MOHR WERNER
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