公开(公告)号：US09360368B1

公开(公告)日：2016-06-07

申请号：US14306521

申请日：2014-06-17

Applicant: EXELIS, INC.

Inventor： Kenneth K. Ellis

IPC: G01J4/00 ,  G01J4/04

CPC classification number: G01J4/04 ,  G01J1/0429 ,  G01J1/08 ,  G01J3/0224 ,  G01J3/28 ,  G01J2001/083

Abstract: Measuring the polarimetric response of an optical instrument includes the steps of: emitting light along an optical axis; receiving the light through first and second polarizers; and detecting the light received through the first and second polarizers, using a filter and a detector. A first set of measurements is obtained by measuring the intensity of light received through the first and second polarizers. A second set of measurements is obtained by placing an optical instrument along the optical axis in lieu of the filter and detector; and measuring the intensity of light received through the first polarizer, after the second polarizer has been removed. A third set of measurements is obtained using the optical instrument but having the second polarizer replace the first polarizer. The optical instrument may be characterized using the first, second and third sets of measurements. The characterization is completed without having to know the extinction ratios and the transmittance parameters of the polarizers.

Abstract translation: 测量光学仪器的偏振响应包括以下步骤：沿光轴发射光; 通过第一和第二偏振器接收光; 以及使用滤波器和检测器检测通过第一和第二偏振器接收的光。 通过测量通过第一和第二偏振器接收的光的强度来获得第一组测量。 通过沿着光轴放置光学仪器来代替滤光器和检测器来获得第二组测量; 并且在去除了第二偏振器之后测量通过第一偏振器接收的光的强度。 使用光学仪器获得第三组测量值，但是具有第二偏振器来代替第一偏振器。 可以使用第一，第二和第三组测量来表征光学仪器。 表征完成，而不必知道偏振器的消光比和透射率参数。

公开(公告)号：US09459152B1

公开(公告)日：2016-10-04

申请号：US15137558

申请日：2016-04-25

Applicant: Exelis, Inc.

Inventor： Kenneth K. Ellis

IPC: G01J4/00 ,  G01J4/04

CPC classification number: G01J4/04 ,  G01J1/0429 ,  G01J1/08 ,  G01J3/0224 ,  G01J3/28 ,  G01J2001/083

Abstract: Measuring the polarimetric response of an optical instrument includes the steps of: emitting light along an optical axis; receiving the light through first and second polarizers; and detecting the light received through the first and second polarizers, using a filter and a detector. A first set of measurements is obtained by measuring the intensity of light received through the first and second polarizers. A second set of measurements is obtained by placing an optical instrument along the optical axis in lieu of the filter and detector; and measuring the intensity of light received through the first polarizer, after the second polarizer has been removed. A third set of measurements is obtained using the optical instrument but having the second polarizer replace the first polarizer. The optical instrument may be characterized using the first, second and third sets of measurements. The characterization is completed without having to know the extinction ratios and the transmittance parameters of the polarizers.

公开(公告)号：US09360316B2

公开(公告)日：2016-06-07

申请号：US13936638

申请日：2013-07-08

Applicant: EXELIS, INC.

Inventor： Kenneth K. Ellis

IPC: H01J40/00 ,  G01C11/02 ,  G02B26/10

CPC classification number: G01C11/025 ,  G02B26/10

Abstract: A line scanner scans in a cross track direction and moves forward on a platform in an along track direction. The line scanner includes a plurality of detectors forming a left array and a plurality of detectors forming a right array. The left array and the right array are tilted away from a line formed in the along track direction. The left array is configured to detect scene radiance from a surface of an object when the line scanner is scanning the surface on the right side of the line formed in the along track direction. The right array is configured to detect scene radiance from the surface of the object when the line scanner is scanning the surface to the left side of the line formed in the along track direction. The detectors in each respective array are configured to simultaneously detect the scene radiance.

Abstract translation: 线扫描仪沿横向方向扫描，并在平台上沿着轨道方向向前移动。 线扫描器包括形成左阵列的多个检测器和形成右阵列的多个检测器。 左阵列和右阵列与沿着轨道方向形成的线倾斜。 左阵列被配置为当线扫描器扫描沿着沿着轨迹方向形成的线的右侧的表面时，从物体的表面检测场景辐射。 正确的阵列被配置为当线扫描器扫描沿着轨道方向形成的线的表面到物体的左侧时，从物体的表面检测场景辐射。 每个阵列中的检测器被配置成同时检测场景辐射。