Abstract:
A semiconductor memory device comprises an internal voltage generator (18) which, when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator (18) consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit (14) inactivates the internal voltage generator (18). When the internal voltage generator (18) is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. During the low power consumption mode, an external voltage supplying circuit supplies a power supply voltage supplied from the exterior as the internal voltage to a predetermined internal circuit. Even when the internal voltage generator (18) is inactivated, therefore, the power supply voltage is supplied to the power supply terminal of each internal circuit, which results in preventing a leak path. For low power mode, data are saved from a dynamic memory to a flash memory. During low power mode, refresh operation of the dynamic memory is prohibited.
Abstract:
A transistor (11) of a driver (5) in a semiconductor integrated circuit has its gate connected to a controlling circuit (41), and has its drain connected to a sense amplifier (AMP). The controlling circuit (41)supplies the gate of the transistor (11) with a gate-to-source voltage exceeding or below other power supply voltages. The drain-to-source resistance of the transistor (11) in the on state becomes sufficiently lower as compared with that in the case of supplying the power supply voltages between the gate and source of the transistor (11). Accordingly, the amplifying speed of the sense amplifier (AMP) is heightened without altering the sense amplifier (AMP) and the driver (5). Besides, the amplifying speed of the sense amplifier (AMP) is heightened without raising the power supply voltage which supplies the carriers to the driver (5).
Abstract:
A transistor (11) of a driver (5) in a semiconductor integrated circuit has its gate connected to a controlling circuit (41), and has its drain connected to a sense amplifier (AMP). The controlling circuit (41) supplies the gate of the transistor (11) with a gate-to-source voltage exceeding or below other power supply voltages. The drain-to-source resistance of the transistor (11) in the on state becomes sufficiently lower as compared with that in the case of supplying the power supply voltages between the gate and source of the transistor (11). Accordingly, the amplifying speed of the sense amplifier (AMP) is heightened without altering the sense amplifier (AMP) and the driver (5). Besides, the amplifying speed of the sense amplifier (AMP) isheightened without raising the power supply voltage which supplies the carriers to the driver (5).
Abstract:
A transistor (11) of a driver (5) in a semiconductor integrated circuit has its gate connected to a controlling circuit (41), and has its drain connected to a sense amplifier (AMP). The controlling circuit (41) supplies the gate of the transistor (11) with a gate-to-source voltage exceeding or below other power supply voltages. The drain-to-source resistance of the transistor (11) in the on state becomes sufficiently lower as compared with that in the case of supplying the power supply voltages between the gate and source of the transistor (11). Accordingly, the amplifying speed of the sense amplifier (AMP) is heightened without altering the sense amplifier (AMP) and the driver (5). Besides, the amplifying speed of the sense amplifier (AMP) isheightened without raising the power supply voltage which supplies the carriers to the driver (5).
Abstract:
A transistor (11) of a driver (5) in a semiconductor integrated circuit has its gate connected to a controlling circuit (41), and has its drain connected to a sense amplifier (AMP). The controlling circuit (41)supplies the gate of the transistor (11) with a gate-to-source voltage exceeding or below other power supply voltages. The drain-to-source resistance of the transistor (11) in the on state becomes sufficiently lower as compared with that in the case of supplying the power supply voltages between the gate and source of the transistor (11). Accordingly, the amplifying speed of the sense amplifier (AMP) is heightened without altering the sense amplifier (AMP) and the driver (5). Besides, the amplifying speed of the sense amplifier (AMP) is heightened without raising the power supply voltage which supplies the carriers to the driver (5).
Abstract:
A semiconductor memory device comprises an internal voltage generator (18) which, when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator (18) consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit (14) inactivates the internal voltage generator (18). When the internal voltage generator (18) is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. During the low power consumption mode, an external voltage supplying circuit supplies a power supply voltage supplied from the exterior as the internal voltage to a predetermined internal circuit. Even when the internal voltage generator (18) is inactivated, therefore, the power supply voltage is supplied to the power supply terminal of each internal circuit, which results in preventing a leak path. During low power consumption mode, refresh of the dynamic memory cells is prohibited.