Abstract:
A photomask manufacturing method includes a defect information storage step of storing defect information of a mask blank, provided with an identification marker on an end face thereof, into an information storage device in correspondence to the identification marker, a placing orientation determination step of determining a placing orientation of the mask blank with respect to an exposure/writing apparatus, and an orientation correction step of performing rotation control of a rotating apparatus so that an orientation of the mask blank coincides with the determined placing orientation.
Abstract:
A mask blank glass substrate is for use in manufacturing a mask blank. In the mask blank glass substrate, a marker expressing, by a plurality of pits, information for identifying or managing the mask blank glass substrate is formed on a surface of a region, having no influence on formation of a transfer pattern, of the mask blank glass substrate. Each of the pits forming the marker is a round hole with its edge portion being generally circular and a distance L1 between the edge portions of the adjacent pits is 50 μm or more. The marker is formed, for example, on an end face of the mask blank glass substrate.
Abstract:
PROBLEM TO BE SOLVED: To appropriately form a marker, which is not likely to cause dust, to a glass substrate for a mask blank. SOLUTION: This glass substrate is used for manufacturing a mask blank. The marker 18 indicating the information for identifying or managing the glass substrate on the surface of a region which is not affected when producing a transfer pattern of the glass substrate by a plurality of recessed parts 20. Each of the recessed parts 20 forming the marker 18 includes an approximately circular round hole on the edge, and the distance L1 between the edges of adjoining recessed parts 20 is 50 μm or more. The marker 18 is formed on the end face of the glass substrate for the mask blank, for example. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PURPOSE:To cut down the manhours needed by a method wherein the resist developing process, which is divided into two processes when an Al pattern is formed, and an etching process is performed in the same process by adhering an Al film on one main surface of a light-transmitting substrate. CONSTITUTION:The substrate 3 with an Al film is manufactured by forming an Al film 2, as a light-transmitting film, on one main surface of a light- transmitting substrate 1 by performing a sputtering method. A positive type photoresist 4 is applied on the Al film 2 of the substrate 3 having an Al film using a spin-coating method, and a positive photoresist 4 is exposed through an exposure mask 5 having a pattern. Then, the positive type photoresist 4 is developed by performing an immersion method using a developing solution exclusively used for the positive type photoresist 4, and after the exposed part of the resist is removed, an Al pattern 8 is formed by etching a resist pattern 7 and the Al film part located under the resist pattern 7. Then, the resist pattern 7 located on the Al pattern 8 is exfoliated using an exfoliating solution, and the substrate 9 with the Al pattern 8 is manufactured.
Abstract:
PROBLEM TO BE SOLVED: To appropriately form a marker on a mask blanks.SOLUTION: A mask blanks 10 is formed of a glass substrate 12 and a mask pattern thin film 14 formed on the glass substrate 12. The glass substrate 12 is formed on a mirror-like surface by irradiation of laser light, and includes a recessed part 20 used as a marker 18. The recessed part 20 is formed, in the glass substrate 12 on an end face orthogonal to the main surface in which the thin film to be a transfer pattern is formed, on an area trimmed by 1.2 mm from both sides of the main surface and an area within 10 mm from the four corners of the glass substrate 12. The marker 18 represents unique identification information, identification symbol, or management symbol of the mask blanks 10.
Abstract:
PROBLEM TO BE SOLVED: To appropriately automating the manufacturing process of a photomask. SOLUTION: A method for manufacturing a photomask is disclosed, including disposing a mask blank 10 on a mounting section of a rotating device, disposing the mask blank 10 on an exposure drawing machine 102 while controlling the direction of the mask blank 10 by the rotating device, and exposing and drawing an image. The method further includes: a defect information storing step of storing defect information in the mask blank having an identification marker 18 provided on an end face 22a, into an information storing device in association with the identification marker 18; a placement direction determining step of determining a placement direction of the mask blank 10 with respect to the exposure drawing machine 102; and a direction correcting step of controlling the rotation of the rotating device so as to control the direction of the mask blank to the determined placement direction. The placement direction determining step includes detecting the identification marker 18 of the mask blank by a detector, inquiring to the information storing device to obtain the defect information, and determining the placement direction based on the drawing information and defect information of the mask pattern. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a mask blank housing case that has both of visibility for checking inside the case and light shielding property suitable for a mask blank having a resist film formed thereon and can maintain stable resist performance for forming a desired mask pattern. SOLUTION: The mask blank housing case is used for housing a mask blank having at least a thin film for forming a transfer pattern on a substrate, wherein at least a part of the case has a light transmitting property in such a content that the housed material is visible from outside the case, and substantially blocks light at a wavelength of 550 nm or shorter. The housing case substantially transmits light at a wavelength of 600 nm or longer. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To properly form a marker less liable to cause dust generation on a mask blank glass substrate. SOLUTION: A mask blank glass substrate used in the manufacture of a mask blank is prepared and a marker 18 expressing information for identifying or managing the mask blank glass substrate in a plurality of recesses 20 is formed on the surface of a region of the mask blank glass substrate having no influence on the fabrication of a transfer pattern. The recesses 20 constituting the marker 18 are round pits having substantially circular edges, and the interval L1 between the adjacent recesses 20 is ≥50 μm. The marker 18 is formed, e.g., on an end face of the mask blank glass substrate. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To form a marker that seldom induces dust on a glass substrate for a mask blank. SOLUTION: A method of manufacturing a mask blank glass substrate 12 includes a marking step where a recess 20 to be used as a marker for identifying or managing the mask blank glass substrate 12 is formed by irradiating a mirror-like surface with a laser beam in an area having no influence on transfer on a surface of the glass substrate 12. The method further includes a step of preparing substrate information about the glass substrate 12, in which the marker is correlated with the substrate information about the glass substrate 12. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a mask blank storage container which prevents contamination by a foreign matter such as a chemical material accompanying the ingress of exterior air, stores a mask blank, etc. keeping a clean atmosphere and prevents the ingress of exterior light. SOLUTION: This storage container provided with a container main body with an open top and a lid to cover the main body stores inside a mask blank having a resist film. A vent hole is formed in the corner of the lid to let exterior air through, and a filter member 6 is mounted on the vent on the container inner side. When exterior air comes in through the vent, a foreign matter such as a chemical material contained in the air is removed by the member 6. When exterior light comes in from the vent, the filter member 6 prevents the light from coming into the container by shifting the optical path not to be linear in the member 6. COPYRIGHT: (C)2007,JPO&INPIT