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    Interface between self-repair chips
    1.
    发明专利
    Interface between self-repair chips 审中-公开
    自我修复界面

    公开(公告)号：JP2004220598A

    公开(公告)日：2004-08-05

    申请号：JP2003431365

    申请日：2003-12-25

    Applicant: Internatl Business Mach Corp ,  インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation

    Inventor： BECKER WIREN DALE ,  DREPS DANIEL MARK ,  FERRAIOLO FRANK D ,  HARIDASS ANAND ,  REESE ROBERT JAMES

    IPC: G06F13/00 ,  G06F11/26 ,  H01L21/66

    CPC classification number: H01L22/22 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: PROBLEM TO BE SOLVED: To provide a method and a device for managing a set of signal paths of a chip and to provide a computer instruction. SOLUTION: A defective signal path among the set of signal paths of the chip is detected. A route of a signal is specified again via the set of signal paths in response to detection of the defective signal path, the defective signal path is eliminated from the set of signal paths and the signal is transmitted by using the remaining data signal path of the set of signal paths and using an excess signal path. In addition, the chip is a data source, a test pattern is generated by the data source, the test pattern is transmitted to a data destination by using the set of signal paths, the received pattern is compared with expected data at the data destination and whether or not the defective signal path exists is determined by utilizing this comparison result. COPYRIGHT: (C)2004,JPO&NCIPI

    Abstract translation: 要解决的问题：提供一种用于管理芯片的一组信号路径并提供计算机指令的方法和装置。 解决方案：检测芯片组的信号路径中的有缺陷的信号路径。 响应于缺陷信号路径的检测，再次通过信号路径集合指定信号的路线，从信号路径组中消除了缺陷信号路径，并且通过使用信号路径的剩余数据信号路径来发送信号 一组信号路径并使用多余的信号路径。 另外，芯片是数据源，由数据源产生测试模式，通过使用该组信号路径将测试模式发送到数据目的地，将接收的模式与数据目的地的预期数据进行比较， 通过利用该比较结果确定存在缺陷信号路径。 版权所有（C）2004，JPO＆NCIPI

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