公开(公告)号：DE2312731A1

公开(公告)日：1973-09-20

申请号：DE2312731

申请日：1973-03-14

Applicant: IBM

Inventor： CARPENTER ROBERT GORDON ,  LINDBLOOM ERIC ,  MCMAHON JUN MAURICE THOMAS

IPC: G01R31/317 ,  G01R31/3183 ,  G06F11/26 ,  G01R31/28

公开(公告)号：DE2256135A1

公开(公告)日：1973-06-20

申请号：DE2256135

申请日：1972-11-16

Applicant: IBM

Inventor： CARPENTER ROBERT GORDON ,  LINDBLOOM ERIC ,  MCMAHON JUN MAURICE THOMAS

IPC: G01R31/28 ,  G01R31/3181 ,  G01R31/3183 ,  G06F11/22 ,  G01R31/26

Abstract: A system for testing complex circuitry primarily in large scale integration where a great number of inputs and outputs must be tested and the internal circuitry is inaccessible. The test system has a weighted random number generator which applies a test signal to some input terminals of the logic under test more frequently than others. A particular input terminal to the logic under test can be accessed in proportion to the circuit switching activity associated with accessing that particular terminal.