Abstract:
PROBLEM TO BE SOLVED: To provide a vertical type field effect transistor array improved in performance, and a method of manufacturing the same. SOLUTION: Each vertical part of each semiconductor pillar in a semiconductor pillar array has a line width greater than a separation distance to a neighboring semiconductor pillar. Alternatively, the array may arbitrarily includes a semiconductor pillar having a different line width within the restriction of the line width and the separation distance. A method of manufacturing the array of the semiconductor pillar uses a pillar mask layer created into a minimum dimension using photolithography, at least one of spacer layers of which is increased in an annular manner before it is used as an etching mask. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a structure and a method for an EEPROM device, having a high performance logic (such as complementary metal-oxide semiconductor(CMOS), for example), or EEPROM device, being integrated with a nonvolatile random access memory(NVRAM). SOLUTION: The EEPROM device is provided with mutually self-matched floating gate and program gate. During programming, electronic tunneling occurs between the floating gate and the program gate.
Abstract:
PROBLEM TO BE SOLVED: To provide a high density content addressable memory array using a phase change device. SOLUTION: The content addressable memory array storing stored words in memory elements is provided. Each memory element stores one of at least two complementary binary bits as one of at least two complementary resistances. Each memory element is electrically coupled to an access device. An aspect of the content addressable memory array is the use of a biasing circuit to bias the access devices during a search operation. During the search operation, a search word containing a bit string is received. Each access device is biased to a complementary resistance value of a corresponding search bit in the search word. A match between the search word and stored word is indicated if the bits stored in the memory elements are complementary to the bits represented by the resistances in the access devices. COPYRIGHT: (C)2010,JPO&INPIT