Integration of confined phase change memory with threshold switching material

    公开(公告)号:GB2573450A

    公开(公告)日:2019-11-06

    申请号:GB201910103

    申请日:2018-01-09

    Applicant: IBM

    Abstract: A phase change memory array and method for fabricating the same. The phase change memory array includes a plurality of bottom electrodes, top electrodes, and memory pillars. Each of the memory pillars includes phase change material surrounded by a dielectric casing. The phase change material is positioned between, and in series circuit with, a respective bottom electrode from the bottom electrodes and a respective top electrode from the top electrodes. A continuous layer of selector material is positioned between the memory pillars and the plurality of bottom electrodes. The selector material is configured to conduct electricity only when a voltage across the selector material exceeds a voltage threshold.

    Integration of confined phase change memory with threshold switching material

    公开(公告)号:GB2573450B

    公开(公告)日:2021-10-06

    申请号:GB201910103

    申请日:2018-01-09

    Applicant: IBM

    Abstract: A phase change memory array and method for fabricating the same. The phase change memory array includes a plurality of bottom electrodes, top electrodes, and memory pillars. Each of the memory pillars includes phase change material surrounded by a dielectric casing. The phase change material is positioned between, and in series circuit with, a respective bottom electrode from the bottom electrodes and a respective top electrode from the top electrodes. A continuous layer of selector material is positioned between the memory pillars and the plurality of bottom electrodes. The selector material is configured to conduct electricity only when a voltage across the selector material exceeds a voltage threshold.

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