公开(公告)号：JPH0682509A

公开(公告)日：1994-03-22

申请号：JP9493

申请日：1993-01-04

Applicant: IBM

Inventor： SHINUU CHIYAN ,  HANTEINTON UTSUDOMAN KAATEISU ,  AASAA YUUJIN FUOORUZU ,  AANORUDO HARUPERIN ,  JIYON PIITAA KARIDEISU ,  JIYON DAKOSUTA MATSUKEI ,  DANII CHIYAN YON UON ,  KA CHIU UU ,  RI CHIEN TSUAI

IPC: G01R31/02 ,  G01R31/28

Abstract: PURPOSE: To perform the test and obstruction separation of a high density receiving circuit board (e.g.; non-mounted circuit board) and a substrate. CONSTITUTION: A small number of movable probes (151, 152) are used to simultaneously perform the measurement of network resistors (R1, R12) and network capacities (c1, c2, c12). Therefore, electrical changeover, excessive probe movement and both of them become unnecessary during a test and a test time is minimized. The simultaneous measurement of network capacities and network leakage is realized by using phase sensibility detection. The capacity value and resistance value of the leak route between a network to be measured and an unknown network can be measured by double frequency measuring technique. The leak resistance between the network during a test and the earth surface or power surface in a circuit board can be also determined from the above mentioned measurement.