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公开(公告)号：US3657709A
公开(公告)日：1972-04-18
申请号：US3657709D
申请日：1969-12-30
Applicant: IBM
Inventor： DREYFUS RUSSELL W
Abstract: A beam addressable display and storage tube having pointwise erase capability. Each localized storage element has associated therewith an erase element which is energized by a writing beam or another beam to provide output energy for erasing the information contained in the associated storage element. In addition to storage and display, memory applications exist. Any beam addressable storage element can be used including those which form color centers or which have their color centers altered upon impact of a beam of energy.
Abstract translation: 具有点擦除功能的光束可寻址显示和存储管。 每个局部存储元件都具有与擦除元件相关联的擦除元件，其由写入光束或另一个光束激励，以提供用于擦除包含在相关联的存储元件中的信息的输出能量。 除了存储和显示外，还存在内存应用程序。 可以使用任何波束可寻址存储元件，包括形成彩色中心的那些或者它们的颜色中心在能量束的冲击时被改变的那些。
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公开(公告)号：US3466616A
公开(公告)日：1969-09-09
申请号：US3466616D
申请日：1965-10-22
Applicant: IBM
Inventor： BRON WALTER E , DREYFUS RUSSELL W , HELLER WILLIAM R
CPC classification number: G11C13/041
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公开(公告)号：CA1236929A
公开(公告)日：1988-05-17
申请号：CA499662
申请日：1986-01-15
Applicant: IBM
Inventor： BEHA JOHANNES G , DREYFUS RUSSELL W , HARTSTEIN ALLAN M , RUBLOFF GARY W
IPC: G01R31/28 , G01R31/308 , H01L21/66 , G01R31/26
Abstract: PHOTON ASSISTED TUNNELING TESTING OF PASSIVATED INTEGRATED CIRCUITS Covering metal test pads of a passivated integrated circuit process intermediate wafer or completed integrated circuit chip-to-test, with a thin conductive overlayer, and then accessing the test pads through the passivation layer and conductive overlayer, by a pulsed laser to provide voltage-modulated photon-assisted tunneling through the insulation layer, to the conductive overlayer as an electron current, and detecting the resulting electron current, provides a nondestructive test of integrated circuits. The passivation, normally present to protect the integrated circuit, also lowers the threshold for photoelectron emission. The conductive overlayer acts as a photoelectron collector for the detector. A chip-to-test which is properly designed for photon assisted tunneling testing has test sites accessible to laser photons even though passivated. Such a chip-to-test may be nondestructively tested in air at one or several stages of its processing, without the sacrifices of mechanical probing or of bringing test sites out to output pads. The conductive overlayer may be removed after tests have been completed. Integrated circuit process intermediate chips may be specially designed for testability, with test sites grouped for easy access through windows left uncovered by subsequent layers.
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公开(公告)号：CA1220559A
公开(公告)日：1987-04-14
申请号：CA482173
申请日：1985-05-23
Applicant: IBM
Inventor： BEHA JOHANNES G , DREYFUS RUSSELL W , RUBLOFF GARY W
IPC: G01R31/302 , G01R31/308 , H01L21/66 , G01R31/28
Abstract: NONCONTACT DYNAMIC TESTER FOR INTEGRATED CIRCUITS Testing of integrated circuit process intermediates, such as warers, dice or chips in various stages of production (test chips) is facilitated by a nonintrusive, noncontact dynamic testing technique, using a pulsed laser, with laser light modification to increase photon energy through conversion to shorter wavelength. The high energy laser light excites electron emissions to pass to the detection system as a composite function of applied light energy and of dynamic operation of the circuit; detecting those emissions by an adjacent detector requires no ohmic contacts or special circuitry on the integrated circuit chip or wafer. Photoelectron energy emitted from a test pad on the test chip is detected as a composite function of the instantaneous input voltage as processed on the test chip, in dynamic operation including improper operation due to fault. The pulse from the laser, as modified through light modification, the parameters of detection of bias voltages, and the distances involved in chipgrid-detector juxtaposition, provides emissions for detection of circuit voltages occurring on the test chip under dynamic conditions simulating actual or stressed operation, with high time resolution of the voltages and their changes on the circuit. Y0984-020
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Patent Agency Ranking
公开(公告)号：CA1232975A
公开(公告)日：1988-02-16
申请号：CA499557
申请日：1986-01-14
Applicant: IBM
Inventor： BEHA JOHANNES G , DREYFUS RUSSELL W , RUBLOFF GARY W
Abstract: NONCONTACT FULL-LINE DYNAMIC AC TESTER FOR INTEGRATED CIRCUITS Simultaneous noncontact testing of voltages across a full line of test sites on an integrated circuit chip-to-test is achieved with high time resolution using photoelectron emission induced by a pulsed laser focussed to a line on the chip-to-test, together with high speed electrostatic deflection perpendicular to the line focus. Photoelectrons produced by the line focus of pulsed laser light are imaged to a line on an array detector, the measured photoelectron intensities at array points along this line representing voltages at corresponding points along the line illuminated by the laser focus. High speed electrostatic deflection applied during the laser pulse, perpendicular to the direction of the line focus, disperses the line image (column) on the array detector across a sequence of sites at right angles (rows), thereby revealing the time-dependence of voltages in the column of test sites with high time resolution (in the picosecond range). Y0984028
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公开(公告)号：CA855387A
公开(公告)日：1970-11-03
申请号：CA855387D
Applicant: IBM
Inventor： BRON WALTER E , DREYFUS RUSSELL W , HELLER WILLIAM R
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公开(公告)号：CA1153818A
公开(公告)日：1983-09-13
申请号：CA352844
申请日：1980-05-27
Applicant: IBM
Inventor： DREYFUS RUSSELL W , LANDON ALFRED J
Abstract: VERSATILE MICROSECOND MULTIPLE FRAMING CAMERA A versatile microsecond multiple framing camera generates a switched beam of illumination derived from a laser and switched by an acousto-optic modulator. The illumination is focused on a subject, and illumination from the subject is caused to scan over a predetermined field by a mechanical or electromechanical scanner. Located in the field is an image recording device for recording the illumination directed over the field by the scanner. The image recording device, in one embodiment, includes a vidicon tube, for short term storage, and a video recorder for longer term storage. A video monitor may be driven from the video recorder. The versatility of the camera is exemplified by the ability to vary exposure times or frame rates by adjusting operator controls which drive the acousto-optic modulator and/or the electromechanical scanner. In other embodiments, the vidicon tube and video recorder can be replaced or supplemented by photographic film. YO978-079
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公开(公告)号：CA1070809A
公开(公告)日：1980-01-29
申请号：CA277435
申请日：1977-04-29
Applicant: IBM
Inventor： DREYFUS RUSSELL W
Abstract: ELECTRON BEAM PUMPED GAS LASER An electron beam pumped gas laser includes an evacuated cavity adapted to house a lasing gas and an electron beam launching means (such as a field emission diode). Means are provided to insert a lasing gas into the cavity so as to produce a traveling density discontinuity. The diode is energized prior to the time the traveling density discontinuity reaches it so as to launch an electron beam under substantially evacuated conditions. The principles of the invention can also be applied to gaseous electron beam transport.
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