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公开(公告)号:CA2006266A1
公开(公告)日:1990-09-10
申请号:CA2006266
申请日:1989-12-20
Applicant: IBM
Inventor: GALEUCHET YVAN , GRAF VOLKER , HEUBERGER WILHELM , ROENTGEN PETER
IPC: H01L29/201 , C30B29/40 , H01L21/20 , H01L21/205 , H01L21/338 , H01L29/775 , H01L29/812 , H01S5/12 , H01S5/223 , H01S5/227 , H01S5/30 , H01S5/32 , H01S5/323 , H01S5/34 , H01S5/40
Abstract: A method, and devices produced therewith, for the epitaxial growth of sub-micron semiconductor structures with at least one crystal plane dependently grown, buried active layer (24) consisting of a III-V compound. The active layer (24) and adjacent embedding layers (23, 25) form a heterostructure produced in a one-step growth process not requiring removal of the sample from the growth chamber inbetween layer depositions. The layers of the structure are grown on a semiconductor substrate (21) having a structured surface exposing regions of different crystal orientation providing growth- and no-growth-planes for the selective growth process. The method allows the production of multiple, closely spaced active layers and of layers consisting of adjoining sections having different physical properties.
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公开(公告)号:CA2006266C
公开(公告)日:1993-01-12
申请号:CA2006266
申请日:1989-12-20
Applicant: IBM
Inventor: GALEUCHET YVAN , GRAF VOLKER , HEUBERGER WILHELM , ROENTGEN PETER
IPC: H01L29/201 , C30B29/40 , H01L21/20 , H01L21/205 , H01L21/338 , H01L29/775 , H01L29/812 , H01S5/12 , H01S5/223 , H01S5/227 , H01S5/30 , H01S5/32 , H01S5/323 , H01S5/34 , H01S5/40 , H01L21/36
Abstract: A method, and devices produced therewith, for the epitaxial growth of sub-micron semiconductor structures with at least one crystal plane dependently grown, buried active layer (24) consisting of a III-V compound. The active layer (24) and adjacent embedding layers (23, 25) form a heterostructure produced in a one-step growth process not requiring removal of the sample from the growth chamber inbetween layer depositions. The layers of the structure are grown on a semiconductor substrate (21) having a structured surface exposing regions of different crystal orientation providing growth- and no-growth-planes for the selective growth process. The method allows the production of multiple, closely spaced active layers and of layers consisting of adjoining sections having different physical properties.
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