公开(公告)号：DE59309544D1

公开(公告)日：1999-06-02

申请号：DE59309544

申请日：1993-05-21

Applicant: IBM

Inventor： KOETZLE GUNTHER ,  KREUTER VOLKER ,  LUDWIG THOMAS ,  SCHETTLER HELMUT

IPC: G05F3/20 ,  H01L27/02

Abstract: PCT No. PCT/DE93/00443 Sec. 371 Date Jul. 17, 1995 Sec. 102(e) Date Jul. 17, 1995 PCT Filed May 21, 1993 PCT Pub. No. WO94/01890 PCT Pub. Date Jan. 20, 1994An integrated semiconductor circuit for reducing power consumption, employing CMOS technology in which a transistor pair can be operated stably at different supply voltages. At each supply voltage the transistors have an associated threshold voltage which can be set via the well and substrate bias voltages. The substrate of the transistor pair is connected to a substrate bias voltage generator circuit and the well is connected to a well bias voltage generator circuit. An input signal representing the level of the supply voltage sets the respective bias voltages corresponding to the level of the supply voltage. Thus, the threshold voltage of each transistor is adapted to the existing supply voltage, thereby ensuring stable operation of the transistor pair. A battery driven data processing system with the integrated semiconductor circuit can attain an approximate 100 fold extension of the operating time of the battery.

公开(公告)号：FR2294450A1

公开(公告)日：1976-07-09

申请号：FR7532217

申请日：1975-10-13

Applicant: IBM

Inventor： KOETZLE GUNTHER

IPC: H02J1/00 ,  G01R17/04 ,  G01R19/165 ,  G05F1/12 ,  H02J3/00 ,  G01R19/16 ,  G05F1/46 ,  H02H9/04

Abstract: A method and apparatus for monitoring and controlling a plurality of power supplies in a computer or similar complex electronic apparatus provides the steps of normalizing each power supply output according to a common nominal val ue, comparing the normalized values to a reference having values according to the normalized upper and lower limits specified for each power supply, and conducting a quantative measurement of out-of-tolerance test values. The specific upper and lower tolerance values for each normalized output are stored in digital form and the measurement of an out-of-tolerance reading is by comparison to a digital ramp extending only from the specific maximum or minimum tolerance threshold which is exceeded. The testing of plural power supplies having the same upper or lower normalized tolerance can be conducted as a group of tests against the same reference.