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公开(公告)号:DE4427309A1
公开(公告)日:1996-02-15
申请号:DE4427309
申请日:1994-08-02
Applicant: IBM
Inventor: DRUSCHKE FRANK DIPL CHEM DR , DIEMER ROLAND , ELSNER GERHARD DIPL PHYS DR , SCHMID WOLFGANG , BRAUN REINHOLD DIPL ING , GRUBER HARALD , BECK WOLFGANG , KRATZERT RAINER DIPL ING
Abstract: A process is disclosed for producing an IC-module that consists of a thin support element (4) upon which is mounted a semiconductor chip (2). This process also allows the use of IC-components (2) of especially large sizes (macrochips) and various types. The chip is injection moulded so that it has a minimum height without requiring further processing and may be economically surface-mounted. The module may be used both in flexible printed circuit cards (for example in photographic cameras) and in smart cards. In a first step of the process, at least one IC-component (2) is applied on the support element (4), in a second step the IC-component (2) is contacted with the support element (4) and in a third step an injection moulding material (18) is injection moulded around the IC-component (2) so as to envelop it.
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公开(公告)号:DE4424396C2
公开(公告)日:1996-12-12
申请号:DE4424396
申请日:1994-07-11
Applicant: IBM
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公开(公告)号:DE4424396A1
公开(公告)日:1996-01-18
申请号:DE4424396
申请日:1994-07-11
Applicant: IBM
Inventor: DRUSCHKE FRANK DIPL CHEM DR , KRATZERT RAINER DIPL ING , GRUBER HARALD , BECK WOLFGANG , DIEMER ROLAND , SCHMID WOLFGANG , BRAUN REINHOLD DIPL ING , ELSNER GERHARD DIPL PHYS DR
Abstract: The proposal is the use of the prior art C4 technique to produce an electrical connection between an IC unit (2) and a substrate component (4) designed for inclusion in chip cards or other data medium boards. This results in facilities for contact between the IC unit (2) and the substrate component (4) permitting a high degree of integration of the IC unit (2) and a correspondingly large number of contacts between the IC unit (2) and its environment, makes contact possible over the entire surface of the IC unit (2) and, for the same requirements for contact between the IC unit (2) and the substrate (4), lower structural heights of the connection between said IC unit (2) and the substrate (4).
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