1.
    发明专利
    未知

    公开(公告)号:DE69526006T2

    公开(公告)日:2003-01-02

    申请号:DE69526006

    申请日:1995-07-13

    Applicant: IBM

    Abstract: An interconnection array layout and method are provided for a plurality of paired line conductors of a given length extending principally parallel. A single crossing region traverses the paired line conductors intermediate the given length, wherein the line conductors of each pair of line conductors cross such that inter-pair capacitive coupling is matched. Intra-pair capacitive coupling is avoided by separating the line conductors of each pair of line conductors by two pitches and disposing therebetween a line conductor of a different pair of line conductors. Applications include semiconductor memory arrays, such as DRAM structures, and address/data busses wherein paired true/complement line conductors are employed.

    2.
    发明专利
    未知

    公开(公告)号:DE69526006D1

    公开(公告)日:2002-05-02

    申请号:DE69526006

    申请日:1995-07-13

    Applicant: IBM

    Abstract: An interconnection array layout and method are provided for a plurality of paired line conductors of a given length extending principally parallel. A single crossing region traverses the paired line conductors intermediate the given length, wherein the line conductors of each pair of line conductors cross such that inter-pair capacitive coupling is matched. Intra-pair capacitive coupling is avoided by separating the line conductors of each pair of line conductors by two pitches and disposing therebetween a line conductor of a different pair of line conductors. Applications include semiconductor memory arrays, such as DRAM structures, and address/data busses wherein paired true/complement line conductors are employed.

Patent Agency Ranking