Gate-all around semiconductor nanowire FETs on bulk semiconductor wafers

    公开(公告)号:GB2514709A

    公开(公告)日:2014-12-03

    申请号:GB201415474

    申请日:2013-02-19

    Applicant: IBM

    Abstract: Non-planar semiconductor devices are provided that include at least one semiconductor nanowire 18" suspended above a semiconductor oxide layer (26) that is present on a first portion (100) of a bulk semiconductor substrate. An end segment of the at least one semiconductor nanowire is attached to a first semiconductor pad region (20A) and another end segment of the at least one semiconductor nanowire is attached to a second semiconductor pad region (20B). The first and second pad regions are located above and are in direct contact with a second portion (102) of the bulk semiconductor substrate which is vertically offsets from the first portion (100). The structure further includes a gate (27) surrounding a central portion (18C) of the at least one semiconductor nanowire, a source region (40, 50A) located on a first side of the gate, and a drain region (40', 50B) located on a second side of the gate which is opposite the first side of the gate.

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