1.
    发明专利
    未知

    公开(公告)号:DE69031460T2

    公开(公告)日:1998-03-26

    申请号:DE69031460

    申请日:1990-10-05

    Applicant: IBM

    Abstract: An improved insulating layer is formed by applying to a suitable substrate an organic solution, prepared by reacting a aminoalkoxysilane monomer, an arylalkoxysilane or arylsilazane monomer and water in a solvent, and then heating the coated substrate under conditions so as to evaporate the solvent and form a layer of cured ladder-type silsesquioxane copolymer. The insulating layer, which demonstrates excellent planarizing and thermal stability characteristics, in particularly useful in semiconductor device applications.

    3.
    发明专利
    未知

    公开(公告)号:DE69031460D1

    公开(公告)日:1997-10-23

    申请号:DE69031460

    申请日:1990-10-05

    Applicant: IBM

    Abstract: An improved insulating layer is formed by applying to a suitable substrate an organic solution, prepared by reacting a aminoalkoxysilane monomer, an arylalkoxysilane or arylsilazane monomer and water in a solvent, and then heating the coated substrate under conditions so as to evaporate the solvent and form a layer of cured ladder-type silsesquioxane copolymer. The insulating layer, which demonstrates excellent planarizing and thermal stability characteristics, in particularly useful in semiconductor device applications.

    4.
    发明专利
    未知

    公开(公告)号:DE69022944D1

    公开(公告)日:1995-11-16

    申请号:DE69022944

    申请日:1990-08-11

    Applicant: IBM

    Abstract: An improved method for anisotropically etching the (100) crystallographic plane of silicon wafers involves immersing the wafers in an etching solution containing an aromatic compound having at least two adjacent hydroxyl groups and a polar functional group on the ring, an amine and water. A quality etch at an appreciably greater rate is achieved.

    10.
    发明专利
    未知

    公开(公告)号:DE69022944T2

    公开(公告)日:1996-05-30

    申请号:DE69022944

    申请日:1990-08-11

    Applicant: IBM

    Abstract: An improved method for anisotropically etching the (100) crystallographic plane of silicon wafers involves immersing the wafers in an etching solution containing an aromatic compound having at least two adjacent hydroxyl groups and a polar functional group on the ring, an amine and water. A quality etch at an appreciably greater rate is achieved.

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